{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T10:10:34Z","timestamp":1740132634263,"version":"3.37.3"},"reference-count":29,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100007350","name":"Consejo Nacional de Ciencia y Tecnolog\u00eda of Mexico","doi-asserted-by":"publisher","award":["CONACYT-CBF2023-2024-1625"],"award-info":[{"award-number":["CONACYT-CBF2023-2024-1625"]}],"id":[{"id":"10.13039\/501100007350","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100005739","name":"Universidad Nacional Aut\u00f3noma de M\u00e9xico","doi-asserted-by":"crossref","award":["UNAM-PAPIIT-IN108424"],"award-info":[{"award-number":["UNAM-PAPIIT-IN108424"]}],"id":[{"id":"10.13039\/501100005739","id-type":"DOI","asserted-by":"crossref"}]},{"DOI":"10.13039\/501100007487","name":"Universidad Aut\u00f3noma de la Ciudad de M\u00e9xico","doi-asserted-by":"publisher","award":["UACM-CCYT-2023-IMP-09","UACM-CCYT-2024-CON-02"],"award-info":[{"award-number":["UACM-CCYT-2023-IMP-09","UACM-CCYT-2024-CON-02"]}],"id":[{"id":"10.13039\/501100007487","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2024.3500051","type":"journal-article","created":{"date-parts":[[2024,11,18]],"date-time":"2024-11-18T18:53:14Z","timestamp":1731955994000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["Measurement of Laser Pulse Energy and Duration Through Air Induced Breakdown Under Electric Field Action"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0009-0005-6512-7840","authenticated-orcid":false,"given":"Ulises","family":"Vargas-Nolasco","sequence":"first","affiliation":[{"name":"Programa de Maestría y Doctorado en Ingeniería, Universidad Nacional Autónoma de México (UNAM), Mexico City, Mexico"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5535-3845","authenticated-orcid":false,"given":"Tupak","family":"Garc\u00eda-Fern\u00e1ndez","sequence":"additional","affiliation":[{"name":"Universidad Autónoma de la Ciudad de México (UACM), Mexico City, Mexico"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9536-4840","authenticated-orcid":false,"given":"Citlali","family":"S\u00e1nchez-Ak\u00e9","sequence":"additional","affiliation":[{"name":"Instituto de Ciencias Aplicadas y Tecnología, UNAM, Mexico City, Mexico"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4253-007X","authenticated-orcid":false,"given":"Mayo","family":"Villagr\u00e1n-Muniz","sequence":"additional","affiliation":[{"name":"Instituto de Ciencias Aplicadas y Tecnología, UNAM, Mexico City, Mexico"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0046-3200","authenticated-orcid":false,"given":"Fausto O.","family":"Bredice","sequence":"additional","affiliation":[{"name":"Centro de Investigaciones Ópticas (CIOp), Manuel B. Gonnet, La Plata, Argentina"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.optmat.2023.114309"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.sab.2007.06.011"},{"issue":"1","key":"ref3","first-page":"33","article-title":"Investigating a laser-induced titanium plasma under an applied static electric field","volume":"36","author":"Asamoah","year":"2021","journal-title":"Spectroscopy"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TPS.2002.807331"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1143\/JJAP.43.1018"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1063\/1.2108154"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1088\/1742-6596\/1219\/1\/012009"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.sab.2018.02.003"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.2961\/jlmn.2011.03.0009"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1063\/1.3021352"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.jare.2010.03.004"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1088\/0022-3727\/37\/20\/008"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1088\/0022-3727\/46\/49\/495202"},{"issue":"1","key":"ref14","first-page":"40","article-title":"Caracterizaci\u00f3n de un plasma-L\u00e1ser en aire empleando un circuito RC","volume":"43","author":"Sarmiento","year":"2011","journal-title":"Revista Colombiana de F\u00edsica"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.apsusc.2005.03.095"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1063\/1.3683453"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2005.1522198"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/27.901264"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1002\/eej.1075"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1088\/0022-3727\/29\/7\/032"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmapro.2020.12.051"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1364\/OL.15.000601"},{"key":"ref23","first-page":"314","article-title":"Polarization of the ionization aureole of a light spark in a constant electric field","volume":"2","author":"Askar\u2019yan","year":"1965","journal-title":"Sov. J. Experim. Theor. Phys. Lett."},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1088\/2058-6272\/abea70"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1039\/c9ja00053d"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.sab.2019.105719"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1063\/1.4821838"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1070\/QE1997v027n06ABEH000974"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1063\/1.1654833"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/10755166.pdf?arnumber=10755166","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,11,29]],"date-time":"2024-11-29T07:01:15Z","timestamp":1732863675000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10755166\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":29,"URL":"https:\/\/doi.org\/10.1109\/tim.2024.3500051","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2025]]}}}