{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,5]],"date-time":"2025-11-05T00:00:56Z","timestamp":1762300856213,"version":"3.37.3"},"reference-count":49,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100012166","name":"National Key Research and Development Program of China","doi-asserted-by":"publisher","award":["2022YFB4500100"],"award-info":[{"award-number":["2022YFB4500100"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Collaborative Innovation Platform Projects of Fuzhou"},{"name":"Xiamen and Quanzhou National Independent Innovation Demonstration Zone"},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"crossref","award":["61836010"],"award-info":[{"award-number":["61836010"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"crossref"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2024.3500055","type":"journal-article","created":{"date-parts":[[2024,11,18]],"date-time":"2024-11-18T18:53:14Z","timestamp":1731955994000},"page":"1-12","source":"Crossref","is-referenced-by-count":2,"title":["Time Expansion of Pulse Echo Signal Implemented for Laser Ranging System With High Precision"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0009-0006-8720-3549","authenticated-orcid":false,"given":"Yuhang","family":"Tu","sequence":"first","affiliation":[{"name":"Sichuan Jiuzhou Aerocont Technologies Company Ltd., Mianyang, Sichuan, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0004-4138-815X","authenticated-orcid":false,"given":"Jiang","family":"Li","sequence":"additional","affiliation":[{"name":"School of Electronic Science and Engineering, Xiamen University, Xiamen, Fujian, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8002-2100","authenticated-orcid":false,"given":"Haojie","family":"Ruan","sequence":"additional","affiliation":[{"name":"School of Electronic Science and Engineering, Xiamen University, Xiamen, Fujian, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2414-9750","authenticated-orcid":false,"given":"Yabin","family":"Deng","sequence":"additional","affiliation":[{"name":"School of Electronic Science and Engineering, Xiamen University, Xiamen, Fujian, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9460-132X","authenticated-orcid":false,"given":"Leilei","family":"Li","sequence":"additional","affiliation":[{"name":"School of Electronic Science and Engineering, Xiamen University, Xiamen, Fujian, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4264-7553","authenticated-orcid":false,"given":"Shan","family":"He","sequence":"additional","affiliation":[{"name":"School of Electronic Science and Engineering, Xiamen University, Xiamen, Fujian, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5915-4088","authenticated-orcid":false,"given":"Donghui","family":"Guo","sequence":"additional","affiliation":[{"name":"School of Electronic Science and Engineering, Xiamen University, Xiamen, Fujian, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3197771"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3260279"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3056643"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1117\/1.OE.56.3.031220"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.rse.2016.08.018"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.foreco.2019.117484"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSTQE.2020.3022948"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3190060"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/S0921-8890(02)00247-6"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1061\/(ASCE)HY.1943-7900.0001777"},{"key":"ref11","doi-asserted-by":"crossref","DOI":"10.1016\/j.measurement.2023.113988","article-title":"Development of a novel multi-line laser triangulation scanning system based on the rotary diffraction grating","volume":"225","author":"Wang","year":"2024","journal-title":"Measurement"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/LPT.2022.3207810"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3026441"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/JLT.2021.3131027"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2946429"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3338707"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3235450"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1117\/12.2034878"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2022.3163740"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/LPT.2019.2948471"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.optcom.2020.126066"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/LPT.2017.2771415"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/JLT.2022.3217088"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3249246"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.3390\/rs14122851"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1364\/OPTICA.408657"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1038\/nphoton.2009.94"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1038\/s41566-021-00945-1"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1038\/srep31770"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2022.107414"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2012.2215800"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2907776"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2014.2327282"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2020.3022714"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.2995249"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2023.112801"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2023.3335657"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2023.106068"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2024.3370941"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.3390\/electronics12163478"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1088\/1748-0221\/18\/07\/P07023"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3117632"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.3390\/s22062146"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3277948"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2009.2017006"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.2970704"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1117\/12.2247342"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1117\/12.2247533"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3096281"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/10756764.pdf?arnumber=10756764","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,12,13]],"date-time":"2024-12-13T06:53:13Z","timestamp":1734072793000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10756764\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":49,"URL":"https:\/\/doi.org\/10.1109\/tim.2024.3500055","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2025]]}}}