{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,2]],"date-time":"2026-07-02T05:32:17Z","timestamp":1782970337418,"version":"3.54.5"},"reference-count":32,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62171011"],"award-info":[{"award-number":["62171011"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004826","name":"Beijing Natural Science Foundation","doi-asserted-by":"publisher","award":["4232006"],"award-info":[{"award-number":["4232006"]}],"id":[{"id":"10.13039\/501100004826","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2024.3502721","type":"journal-article","created":{"date-parts":[[2024,11,20]],"date-time":"2024-11-20T19:00:08Z","timestamp":1732129208000},"page":"1-15","source":"Crossref","is-referenced-by-count":5,"title":["Accurate Microwave Near-Field Imaging of Multiple High-Order Scattering Objects Using Iterative Tracing Algorithm"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-5613-1892","authenticated-orcid":false,"given":"Junhui","family":"Yang","sequence":"first","affiliation":[{"name":"School of Electronics and Information Engineering, Beihang University, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8758-3146","authenticated-orcid":false,"given":"Xiaodong","family":"Zhuge","sequence":"additional","affiliation":[{"name":"School of Electronics and Information Engineering, Beihang University, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0005-3083-6110","authenticated-orcid":false,"given":"Hui","family":"Qiao","sequence":"additional","affiliation":[{"name":"School of Electronics and Information Engineering, Beihang University, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0006-3731-6254","authenticated-orcid":false,"given":"Baige","family":"Xing","sequence":"additional","affiliation":[{"name":"School of Electronics and Information Engineering, Beihang University, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8772-7602","authenticated-orcid":false,"given":"Jungang","family":"Miao","sequence":"additional","affiliation":[{"name":"School of Electronics and Information Engineering, Beihang University, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/tgrs.2010.2053038"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2023.3306535"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/tap.2022.3209244"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tap.2020.3016407"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2020.3004683"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3238036"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.2980340"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2861078"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/LAWP.2021.3138512"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/LGRS.2021.3064615"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00768"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2012.2188036"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/36.298008"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3244843"},{"key":"ref15","volume-title":"Principles of Optics: Electromagnetic Theory of Propagation, Interference and Diffraction of Light","author":"Born","year":"1980"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.1983.4307637"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/MAP.2016.2569447"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/LGRS.2018.2815042"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1117\/12.887922"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1117\/12.606825"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.3389\/fphy.2023.1119806"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ICMMT55580.2022.10023083"},{"issue":"6","key":"ref23","first-page":"950","article-title":"Fast imaging algorithm of dihedral based on high-order boundary scattering transform","volume":"38","author":"Yang","year":"2023","journal-title":"Chin. J. Radio Sci."},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2011.2158108"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2019.2957315"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/LGRS.2022.3169514"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/8.18706"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TAP.2009.2016691"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1364\/OE.430950"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TAES.2024.3465494"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2022.3182478"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2009.2036909"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/10758795.pdf?arnumber=10758795","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,12,11]],"date-time":"2024-12-11T22:09:01Z","timestamp":1733954941000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10758795\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":32,"URL":"https:\/\/doi.org\/10.1109\/tim.2024.3502721","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}