{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,8]],"date-time":"2026-02-08T08:07:22Z","timestamp":1770538042521,"version":"3.49.0"},"reference-count":33,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51821005"],"award-info":[{"award-number":["51821005"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2024.3502774","type":"journal-article","created":{"date-parts":[[2024,11,28]],"date-time":"2024-11-28T18:51:53Z","timestamp":1732819913000},"page":"1-10","source":"Crossref","is-referenced-by-count":5,"title":["An Arc Grounding Fault Detection Method in Distribution Networks Using Chaotic DC Waveform Recognition"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-5251-5063","authenticated-orcid":false,"given":"Shiwu","family":"Yang","sequence":"first","affiliation":[{"name":"Institute of Artificial Intelligence, Huazhong University of Science and Technology, Wuhan, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5665-8018","authenticated-orcid":false,"given":"Qing","family":"Chen","sequence":"additional","affiliation":[{"name":"School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3483-1307","authenticated-orcid":false,"given":"Hongbin","family":"Li","sequence":"additional","affiliation":[{"name":"Institute of Artificial Intelligence, Huazhong University of Science and Technology, Wuhan, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1046-682X","authenticated-orcid":false,"given":"Yang","family":"Jiao","sequence":"additional","affiliation":[{"name":"Institute of Artificial Intelligence, Huazhong University of Science and Technology, Wuhan, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0008-1028-498X","authenticated-orcid":false,"given":"Ruoyan","family":"Tian","sequence":"additional","affiliation":[{"name":"School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0007-5623-872X","authenticated-orcid":false,"given":"Yuxiang","family":"He","sequence":"additional","affiliation":[{"name":"School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3821-5467","authenticated-orcid":false,"given":"Chuanji","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0004-1786-3635","authenticated-orcid":false,"given":"Chang","family":"Liu","sequence":"additional","affiliation":[{"name":"School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2018.2873017"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3298416"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1049\/gtd2.12087"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3335520"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1049\/gtd2.12071"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2022.3174481"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1049\/iet-smt.2017.0231"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSYST.2022.3202809"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1049\/gtd2.12678"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2016.10.021"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-33409-2_47"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/PICA.1995.515270"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRS.2012.2215630"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2024.3368477"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2018.2791986"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2015.2434993"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSYST.2019.2942093"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/PESGRE45664.2020.9070573"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1049\/iet-gtd.2018.0093"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2021.107681"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1002\/2050-7038.12760"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2014.2361207"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2022.108909"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2017.2776238"},{"key":"ref25","doi-asserted-by":"crossref","first-page":"474","DOI":"10.1016\/j.epsr.2017.08.039","article-title":"High impedance fault detection in power distribution systems using wavelet transform and evolving neural network","volume":"154","author":"Silva","year":"2018","journal-title":"Electr. Power Syst. Res."},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.jksues.2019.07.001"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2005.852367"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3060800"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2008.4547234"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.3036632"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2023.3244217"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1145\/3097983.3098060"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/CCECE.2008.4564660"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/10771644.pdf?arnumber=10771644","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,12,11]],"date-time":"2024-12-11T00:57:27Z","timestamp":1733878647000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10771644\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":33,"URL":"https:\/\/doi.org\/10.1109\/tim.2024.3502774","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}