{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,7]],"date-time":"2026-03-07T18:31:23Z","timestamp":1772908283769,"version":"3.50.1"},"reference-count":30,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100015341","name":"Key Laboratory of Engineering Dielectrics and Its Application (Harbin University of Science and Technology), Ministry of Education","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100015341","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100015341","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52407175"],"award-info":[{"award-number":["52407175"]}],"id":[{"id":"10.13039\/501100015341","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100005089","name":"Beijing Natural Science Foundation","doi-asserted-by":"publisher","award":["3244048"],"award-info":[{"award-number":["3244048"]}],"id":[{"id":"10.13039\/501100005089","id-type":"DOI","asserted-by":"publisher"}]},{"name":"National Postdoctoral Research Program","award":["GZC20231210"],"award-info":[{"award-number":["GZC20231210"]}]},{"name":"Science Fund Program for Distinguished Young Scholars","award":["23FAA00813"],"award-info":[{"award-number":["23FAA00813"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2024.3502891","type":"journal-article","created":{"date-parts":[[2024,11,25]],"date-time":"2024-11-25T18:43:38Z","timestamp":1732560218000},"page":"1-10","source":"Crossref","is-referenced-by-count":6,"title":["Intelligent Scheme for Partial Discharge Signals Denoising in Gas-Insulated Equipment via Improved Zebra Optimization"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-2283-8328","authenticated-orcid":false,"given":"Xianhao","family":"Fan","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering, Tsinghua University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2849-9574","authenticated-orcid":false,"given":"Fangwei","family":"Liang","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Tsinghua University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0009-3829-1994","authenticated-orcid":false,"given":"Hanhua","family":"Luo","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Tsinghua University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0000-5992-0846","authenticated-orcid":false,"given":"Mingze","family":"Zhang","sequence":"additional","affiliation":[{"name":"Key Laboratory of Engineering Dielectrics and Its Application, Ministry of Education, Harbin University of Science and Technology, Harbin, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3702-2647","authenticated-orcid":false,"given":"Chuanyang","family":"Li","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Tsinghua University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4458-5026","authenticated-orcid":false,"given":"Jinliang","family":"He","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Tsinghua University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6463\/aa5207"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1063\/1.5096228"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/tii.2020.3014224"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.23919\/ien.2023.0036"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1049\/hve2.12388"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2022.3210572"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2022.3153835"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2938905"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.12720\/ijsps.1.2.268-272"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3156156"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2023.3269725"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3216583"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2023.3296764"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2023.3319654"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1049\/iet-smt.2017.0201"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3264044"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2020.2974751"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.2978570"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2023.3336934"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2021.3120975"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3334357"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2937912"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3059707"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2015.005430"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2007.4401238"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3191712"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3063979"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3121477"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TNSRE.2017.2775058"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2022.3172789"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/10767378.pdf?arnumber=10767378","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,12,4]],"date-time":"2024-12-04T19:04:48Z","timestamp":1733339088000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10767378\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":30,"URL":"https:\/\/doi.org\/10.1109\/tim.2024.3502891","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}