{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,6]],"date-time":"2025-12-06T16:49:47Z","timestamp":1765039787210,"version":"3.37.3"},"reference-count":31,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundations of China","doi-asserted-by":"publisher","award":["51977215","51825703"],"award-info":[{"award-number":["51977215","51825703"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2024.3509588","type":"journal-article","created":{"date-parts":[[2024,12,2]],"date-time":"2024-12-02T18:38:33Z","timestamp":1733164713000},"page":"1-10","source":"Crossref","is-referenced-by-count":4,"title":["Motor Interturn Short-Circuit Fault Detection Using Leakage Current"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-7591-1795","authenticated-orcid":false,"given":"Yunfei","family":"Hu","sequence":"first","affiliation":[{"name":"School of Electrical Engineering, Southeast University, Nanjing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3751-6815","authenticated-orcid":false,"given":"Siwei","family":"Cheng","sequence":"additional","affiliation":[{"name":"National Key Laboratory of Electromagnetic Energy, Naval University of Engineering, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9690-9432","authenticated-orcid":false,"given":"Jinghua","family":"Hu","sequence":"additional","affiliation":[{"name":"National Key Laboratory of Electromagnetic Energy, Naval University of Engineering, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8721-6474","authenticated-orcid":false,"given":"Wen","family":"Huang","sequence":"additional","affiliation":[{"name":"National Key Laboratory of Electromagnetic Energy, Naval University of Engineering, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6119-4959","authenticated-orcid":false,"given":"Xinghong","family":"Li","sequence":"additional","affiliation":[{"name":"National Key Laboratory of Electromagnetic Energy, Naval University of Engineering, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0002-4301-3875","authenticated-orcid":false,"given":"Qihang","family":"Sun","sequence":"additional","affiliation":[{"name":"College of Electrical Engineering, Zhejiang University, Hangzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1049\/iet-epa.2016.0196"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.23919\/icems52562.2021.9634348"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.23919\/icems52562.2021.9634621"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2020.3009563"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2024.3415792"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2019.2963295"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3172751"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3195487"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2023.3273897"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2019.2946525"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/PSET56192.2022.10100348"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2020.3011692"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3066193"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/PEAC56338.2022.9959659"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3125653"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2024.3352077"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2022.3169173"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3207181"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2022.3227628"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2021.3067915"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2021.3054674"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3167164"},{"issue":"13","key":"ref23","doi-asserted-by":"crossref","first-page":"2827","DOI":"10.3390\/electronics12132827","article-title":"Search-coil based stator interturn fault detection in permanent magnet machines running under dynamic condition","volume":"12","author":"Huang","year":"2023","journal-title":"Electronics"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2023.3274879"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2024.3403170"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3013128"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3186061"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3064184"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/icpadm.2009.5252199"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/ECTC.2005.1441429"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2024.3360631"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/10772272.pdf?arnumber=10772272","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,12,17]],"date-time":"2024-12-17T06:03:39Z","timestamp":1734415419000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10772272\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":31,"URL":"https:\/\/doi.org\/10.1109\/tim.2024.3509588","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2025]]}}}