{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T10:10:46Z","timestamp":1740132646402,"version":"3.37.3"},"reference-count":33,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["12105230","62204198","12305205"],"award-info":[{"award-number":["12105230","62204198","12305205"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2024.3509594","type":"journal-article","created":{"date-parts":[[2024,12,9]],"date-time":"2024-12-09T18:51:16Z","timestamp":1733770276000},"page":"1-8","source":"Crossref","is-referenced-by-count":0,"title":["Study on Properties of a Hybrid Photomultiplier Tube Based on a SiC Schottky Diode Combined With an MCP"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-8329-5953","authenticated-orcid":false,"given":"Jinlu","family":"Ruan","sequence":"first","affiliation":[{"name":"National Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology, Xi’an, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3938-7460","authenticated-orcid":false,"given":"Liang","family":"Chen","sequence":"additional","affiliation":[{"name":"National Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology, Xi’an, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3256-9344","authenticated-orcid":false,"given":"Pengxiao","family":"Xu","sequence":"additional","affiliation":[{"name":"55th Research Institute of China Electronics Technology Group Corporation, Nanjing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6812-2010","authenticated-orcid":false,"given":"Yapeng","family":"Zhang","sequence":"additional","affiliation":[{"name":"National Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology, Xi’an, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8171-6702","authenticated-orcid":false,"given":"Xue","family":"Du","sequence":"additional","affiliation":[{"name":"Department of Engineering Physics, Tsinghua University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9333-1436","authenticated-orcid":false,"given":"Fangbao","family":"Wang","sequence":"additional","affiliation":[{"name":"National Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology, Xi’an, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3951-2199","authenticated-orcid":false,"given":"Shiyi","family":"He","sequence":"additional","affiliation":[{"name":"National Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology, Xi’an, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7098-0532","authenticated-orcid":false,"given":"Xun","family":"Zhang","sequence":"additional","affiliation":[{"name":"Department of Engineering Physics, Tsinghua University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7153-3224","authenticated-orcid":false,"given":"Yang","family":"Li","sequence":"additional","affiliation":[{"name":"National Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology, Xi’an, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2894-0435","authenticated-orcid":false,"given":"Peng","family":"Jin","sequence":"additional","affiliation":[{"name":"National Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology, Xi’an, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8474-2869","authenticated-orcid":false,"given":"Xiaoping","family":"Ouyang","sequence":"additional","affiliation":[{"name":"National Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology, Xi’an, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3052-5556","authenticated-orcid":false,"given":"Leidang","family":"Zhou","sequence":"additional","affiliation":[{"name":"School of Microelectronics, Xi’an Jiaotong University, Xi’an, China"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1063\/5.0040730"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1016\/j.nima.2021.165252"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1007\/s41365-021-00846-6"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1016\/j.nima.2013.11.030"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1109\/TIM.2020.3023203"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1088\/1361-6587\/ab5137"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1007\/s10894-018-0195-9"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1007\/s10894-019-00213-9"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1063\/5.0029005"},{"issue":"4","key":"ref10","first-page":"399","article-title":"Thin plastic scintillating foil for measuring pulsed neutron flux in high gamm-ray environment","volume":"29","author":"Ouyang","year":"2005","journal-title":"High Energy Phys. Nucl. Phys."},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1063\/1.5048230"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1109\/TIM.2020.3045204"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1109\/TIM.2018.2877952"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1109\/IEDM.1957.187037"},{"doi-asserted-by":"publisher","key":"ref15","DOI":"10.1016\/S0168-9002(03)00431-5"},{"doi-asserted-by":"publisher","key":"ref16","DOI":"10.1016\/j.nima.2005.10.001"},{"volume-title":"Radiation Detection and Measurement","year":"2010","author":"Knoll","key":"ref17"},{"doi-asserted-by":"publisher","key":"ref18","DOI":"10.1088\/1742-6596\/888\/1\/012160"},{"doi-asserted-by":"publisher","key":"ref19","DOI":"10.1016\/j.nima.2014.06.010"},{"doi-asserted-by":"publisher","key":"ref20","DOI":"10.1016\/j.nima.2010.11.003"},{"doi-asserted-by":"publisher","key":"ref21","DOI":"10.1016\/j.nima.2009.05.053"},{"doi-asserted-by":"publisher","key":"ref22","DOI":"10.1016\/S0168-9002(99)01216-4"},{"doi-asserted-by":"publisher","key":"ref23","DOI":"10.1109\/TNS.2019.2901797"},{"volume-title":"Radiation hardness\/tolerance of Si sensors\/detectors for nuclear and high energy physics experiments","year":"2002","author":"Li","key":"ref24"},{"doi-asserted-by":"publisher","key":"ref25","DOI":"10.1088\/1748-0221\/15\/02\/P02010"},{"doi-asserted-by":"publisher","key":"ref26","DOI":"10.1016\/j.nima.2023.168883"},{"doi-asserted-by":"publisher","key":"ref27","DOI":"10.1038\/s41598-017-13715-3"},{"doi-asserted-by":"publisher","key":"ref28","DOI":"10.1007\/s11433-022-2021-6"},{"volume-title":"Response of weapons detectors to fast rising signals. Part I. The detector response function","year":"1963","author":"Dickinson","key":"ref29"},{"volume-title":"Semiconductor detectors for use in the current mode","year":"1971","author":"Kuckuck","key":"ref30"},{"doi-asserted-by":"publisher","key":"ref31","DOI":"10.1109\/TNS.1966.4323952"},{"volume-title":"Microchannel Plate PMTs (MCP-PMT)","year":"2024","key":"ref32"},{"doi-asserted-by":"publisher","key":"ref33","DOI":"10.1016\/j.nima.2021.165495"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/10787134.pdf?arnumber=10787134","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,1,15]],"date-time":"2025-01-15T19:42:00Z","timestamp":1736970120000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10787134\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":33,"URL":"https:\/\/doi.org\/10.1109\/tim.2024.3509594","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2025]]}}}