{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,10]],"date-time":"2026-07-10T16:31:42Z","timestamp":1783701102811,"version":"3.55.0"},"reference-count":40,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100010857","name":"Major Science and Technology Special Project of Yunnan Provincial Department of Science and Technology","doi-asserted-by":"publisher","award":["202202AD080004"],"award-info":[{"award-number":["202202AD080004"]}],"id":[{"id":"10.13039\/501100010857","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2024.3522390","type":"journal-article","created":{"date-parts":[[2025,1,8]],"date-time":"2025-01-08T15:04:52Z","timestamp":1736348692000},"page":"1-13","source":"Crossref","is-referenced-by-count":9,"title":["A Two-Stage Insulator Defect Detection Network With Sequence Transduction"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0009-0001-4326-9136","authenticated-orcid":false,"given":"Yingchen","family":"Zhang","sequence":"first","affiliation":[{"name":"School of Electrical Engineering and Automation, Wuhan University, Wuhan, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4324-5609","authenticated-orcid":false,"given":"Bo","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering and Automation, Wuhan University, Wuhan, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2714-949X","authenticated-orcid":false,"given":"Qiuling","family":"Yang","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering and Automation, Wuhan University, Wuhan, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4668-4113","authenticated-orcid":false,"given":"Fei","family":"Tang","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering and Automation, Wuhan University, Wuhan, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0006-9830-2147","authenticated-orcid":false,"given":"Kaizhe","family":"Wei","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering and Automation, Wuhan University, Wuhan, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2017.2716862"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/tii.2021.3098506"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/tsg.2020.2970156"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tdei.2017.006840"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2020.3012780"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/tsmc.2018.2871750"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2022.3201499"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2024.3418082"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2021.3106112"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2022.3211558"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2024.3390695"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/tpwrd.2023.3311643"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/tits.2020.3020287"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV48922.2021.00350"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.3390\/en11020340"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/tdei.2011.5739465"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/tii.2021.3123107"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/tii.2022.3224956"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/tii.2022.3227638"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.255"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-58452-8_13"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV48922.2021.00986"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2023.3241994"},{"key":"ref24","article-title":"DAB-DETR: Dynamic anchor boxes are better queries for DETR","author":"Liu","year":"2022","journal-title":"arXiv:2201.12329"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV48922.2021.00363"},{"key":"ref26","article-title":"Insulator defect detection","author":"Lewis","journal-title":"IEEE Dataport"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/tpami.2015.2465908"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.90"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/tpami.2020.2974745"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1609\/aaai.v35i4.16426"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/tgrs.2021.3062048"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52688.2022.00187"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-10602-1_48"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/tpami.2016.2577031"},{"key":"ref35","article-title":"YOLOX: Exceeding YOLO series in 2021","author":"Ge","year":"2021","journal-title":"arXiv:2107.08430"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00644"},{"key":"ref37","first-page":"1","article-title":"Deformable DETR: Deformable transformers for end-to-end object detection","volume-title":"Proc. ICLR","author":"Zhu"},{"key":"ref38","first-page":"1","article-title":"DINO DETR with improved denoising anchor","volume-title":"Proc. ICLR","author":"Zhang"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2024.3385817"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2019.00296"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/10834499.pdf?arnumber=10834499","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,7,26]],"date-time":"2025-07-26T07:37:48Z","timestamp":1753515468000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10834499\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":40,"URL":"https:\/\/doi.org\/10.1109\/tim.2024.3522390","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}