{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,6]],"date-time":"2026-02-06T01:21:21Z","timestamp":1770340881454,"version":"3.49.0"},"reference-count":44,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100012166","name":"National Key Research and Development Program of China","doi-asserted-by":"publisher","award":["2022YFF0605600"],"award-info":[{"award-number":["2022YFF0605600"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"crossref","award":["52105550"],"award-info":[{"award-number":["52105550"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"crossref"}]},{"DOI":"10.13039\/501100015973","name":"Scientific Research Foundation of Hubei University of Technology","doi-asserted-by":"publisher","award":["GCC2024001"],"award-info":[{"award-number":["GCC2024001"]}],"id":[{"id":"10.13039\/501100015973","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2024.3522431","type":"journal-article","created":{"date-parts":[[2025,1,6]],"date-time":"2025-01-06T19:24:23Z","timestamp":1736191463000},"page":"1-12","source":"Crossref","is-referenced-by-count":2,"title":["Distinguishing Between Internal and External Defects Based on Stepped Array Sensor in Thick-Walled Ferromagnetic Components"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-1299-6314","authenticated-orcid":false,"given":"Zhiyang","family":"Deng","sequence":"first","affiliation":[{"name":"Key Laboratory of Modern Manufacture Quality Engineering, Hubei University of Technology, Wuhan, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7191-3251","authenticated-orcid":false,"given":"Tingyi","family":"Li","sequence":"additional","affiliation":[{"name":"Key Laboratory of Modern Manufacture Quality Engineering, Hubei University of Technology, Wuhan, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4175-7280","authenticated-orcid":false,"given":"Tingfeng","family":"Ming","sequence":"additional","affiliation":[{"name":"Key Laboratory of Modern Manufacture Quality Engineering, Hubei University of Technology, Wuhan, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2746-4580","authenticated-orcid":false,"given":"Xiaochun","family":"Song","sequence":"additional","affiliation":[{"name":"Key Laboratory of Modern Manufacture Quality Engineering, Hubei University of Technology, Wuhan, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2622-4769","authenticated-orcid":false,"given":"Yihua","family":"Kang","sequence":"additional","affiliation":[{"name":"Huazhong University of Science and Technology, Wuhan, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/tii.2020.3036159"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-59246-2_2"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2023.3272377"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/s13349-023-00694-5"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2022.3188538"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2023.110453"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/tii.2022.3217820"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2023.3348884"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2023.3267354"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.apacoust.2021.108282"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.37965\/jait.2021.0015"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.4236\/eng.2020.128038"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2021.113053"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.4028\/www.scientific.net\/AMM.55-57.239"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2015.05.008"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1007\/s10921-020-00730-0"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/S0963-8695(02)00069-5"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2010.09.001"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3063958"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.35848\/1347-4065\/abaf0c"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3238689"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/19.836321"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1784\/insi.2014.56.1.31"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2021.102405"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2019.05.026"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.47037\/2020.ACES.J.350916"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2023.102895"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2022.102694"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2018.01.009"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3315394"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2023.114437"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/tmag.2004.824100"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2022.3224516"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2021.3121147"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2017.2684858"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1108\/SR-01-2023-0012"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2022.110947"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2023.3267340"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/tii.2018.2843319"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1049\/hve2.12109"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1007\/s10921-018-0520-2"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1002\/etep.1669"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2010.11.001"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1007\/BF02916308"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/10829771.pdf?arnumber=10829771","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,1,10]],"date-time":"2025-01-10T06:02:36Z","timestamp":1736488956000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10829771\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":44,"URL":"https:\/\/doi.org\/10.1109\/tim.2024.3522431","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}