{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,29]],"date-time":"2026-05-29T11:16:44Z","timestamp":1780053404204,"version":"3.54.0"},"reference-count":41,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100002858","name":"China Postdoctoral Science Foundation","doi-asserted-by":"publisher","award":["2024M762595"],"award-info":[{"award-number":["2024M762595"]}],"id":[{"id":"10.13039\/501100002858","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2024.3522677","type":"journal-article","created":{"date-parts":[[2024,12,26]],"date-time":"2024-12-26T19:08:17Z","timestamp":1735240097000},"page":"1-15","source":"Crossref","is-referenced-by-count":6,"title":["Improved Double-Sided Partial Discharge Location Method for High-Voltage Cables via Pulse-Injected Time Synchronization and Variational Mode Decomposition"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-9114-5381","authenticated-orcid":false,"given":"Junbai","family":"Chen","sequence":"first","affiliation":[{"name":"State Key Laboratory of Electrical Insulation and Power Equipment, School of Electrical Engineering, Xi’an Jiaotong University, Xi’an, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9284-1584","authenticated-orcid":false,"given":"Yuan","family":"Yan","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Electrical Insulation and Power Equipment, School of Electrical Engineering, Xi’an Jiaotong University, Xi’an, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3105-8710","authenticated-orcid":false,"given":"Kun","family":"Zhao","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Electrical Insulation and Power Equipment, School of Electrical Engineering, Xi’an Jiaotong University, Xi’an, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9465-1469","authenticated-orcid":false,"given":"Mengxin","family":"Zhu","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Electrical Insulation and Power Equipment, School of Electrical Engineering, Xi’an Jiaotong University, Xi’an, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7131-6534","authenticated-orcid":false,"given":"Li","family":"Wang","sequence":"additional","affiliation":[{"name":"State Grid Ningxia Electric Power Company Ltd., Yinchuan, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4464-5401","authenticated-orcid":false,"given":"Yuxin","family":"Lu","sequence":"additional","affiliation":[{"name":"Jiangxi Electric Power Research Institute, State Grid, Nanchang, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1102-5751","authenticated-orcid":false,"given":"Zhe","family":"Hou","sequence":"additional","affiliation":[{"name":"Equipment Condition Assessment Center, State Grid Shaanxi Electric Power Research Institute, Xi’an, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9546-8938","authenticated-orcid":false,"given":"Hongjie","family":"Li","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Electrical Insulation and Power Equipment, School of Electrical Engineering, Xi’an Jiaotong University, Xi’an, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/tdei.2023.3255174"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2023.3325865"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/mei.2016.7552375"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tpwrd.2023.3256127"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1049\/iet-gtd.2017.1012"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ieeestd.2002.93394"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/EIC43217.2019.9046630"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/PowerCon58120.2023.10330939"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1049\/gtd2.12834"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/tdei.2017.006311"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/tdei.2013.6678872"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ICPADM.2003.1218418"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1049\/cp.2013.0830"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/tpwrd.2022.3221010"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/tpwrd.2010.2099134"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/tdei.2008.4591242"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/access.2021.3077483"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.23919\/CMD54214.2022.9991665"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2018.2816438"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/access.2019.2914064"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2945826"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3334357"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2938905"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.12720\/ijsps.1.2.268-272"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.3390\/en14248579"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2021.106830"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3216583"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.2996717"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2016.005910"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3071224"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2023.3269725"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2013.2246155"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1007\/s11356-021-13516-2"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2021.108216"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2018.07.014"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2020.108185"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1037\/1082-989X.2.3.292"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1049\/joe.2020.0140"},{"issue":"11","key":"ref39","first-page":"318","article-title":"Effects of high frequency partial discharge detection location on its amplitude characteristics in XLPE cable cross bonded system","volume":"37","author":"Gou","year":"2023","journal-title":"J. Chongqing Univ. Technol. (Nat. Sci.)"},{"key":"ref40","volume-title":"High-Voltage Test Technique: Partial Discharge Measurements","year":"2015"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1063\/5.0191802"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/10816339.pdf?arnumber=10816339","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,1,14]],"date-time":"2025-01-14T19:46:01Z","timestamp":1736883961000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10816339\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":41,"URL":"https:\/\/doi.org\/10.1109\/tim.2024.3522677","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}