{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,8]],"date-time":"2025-02-08T05:28:50Z","timestamp":1738992530644,"version":"3.37.0"},"reference-count":24,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100012166","name":"National Key Research and Development Program of China","doi-asserted-by":"publisher","award":["2022YFB2403800"],"award-info":[{"award-number":["2022YFB2403800"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62371338"],"award-info":[{"award-number":["62371338"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"Key Program of Natural Science Foundation of Tianjin","doi-asserted-by":"publisher","award":["21JCZDJC00640"],"award-info":[{"award-number":["21JCZDJC00640"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3533622","type":"journal-article","created":{"date-parts":[[2025,1,24]],"date-time":"2025-01-24T18:29:16Z","timestamp":1737743356000},"page":"1-11","source":"Crossref","is-referenced-by-count":0,"title":["Remote Metrological Verification Method for Electric Vehicle Off-Board Chargers Based on the SIS Infectious Disease Model in a Vehicle-Pile Interaction Network"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-8863-1944","authenticated-orcid":false,"given":"Ting","family":"Yang","sequence":"first","affiliation":[{"name":"School of Electrical and Information Engineering, Tianjin University, Tianjin, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8256-8278","authenticated-orcid":false,"given":"Jie","family":"Yu","sequence":"additional","affiliation":[{"name":"School of Electrical and Information Engineering, Tianjin University, Tianjin, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5361-8344","authenticated-orcid":false,"given":"Haibo","family":"Pen","sequence":"additional","affiliation":[{"name":"School of Electrical and Information Engineering, Tianjin University, Tianjin, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9111-7372","authenticated-orcid":false,"given":"Feng","family":"Zhou","sequence":"additional","affiliation":[{"name":"Metrology Institute, China Electric Power Research Institute, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0000-6354-170X","authenticated-orcid":false,"given":"Bo","family":"Gao","sequence":"additional","affiliation":[{"name":"Metrology Institute, China Electric Power Research Institute, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0000-4786-5704","authenticated-orcid":false,"given":"Heping","family":"Lu","sequence":"additional","affiliation":[{"name":"Metrology Institute, China Electric Power Research Institute, Beijing, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.enpol.2020.111777"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2023.3340739"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.35833\/MPCE.2018.000374"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.est.2021.103273"},{"volume-title":"Global EV Outlook 2024","year":"2024","key":"ref5"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TITS.2020.2990694"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.3390\/s22010322"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3002402"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ITNEC.2019.8729025"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1088\/1755-1315\/252\/3\/032101"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2021.3077693"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3201940"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.5573\/IEIESPC.2022.11.6.444"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/PSGEC54663.2022.9881165"},{"issue":"10","key":"ref15","first-page":"70","article-title":"AMI data-driven electric vehicle charging facility metering operation error state assessment method","volume":"42","author":"Liu","year":"2022","journal-title":"Electr. Power Autom. Equip."},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TCNS.2021.3124269"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.trb.2017.01.020"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.4271\/2010-01-1077"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/CITRES.2010.5619782"},{"key":"ref20","article-title":"An empirical evaluation of generic convolutional and recurrent networks for sequence modeling","author":"Bai","year":"2018","journal-title":"arXiv:1803.01271"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-031-26313-2_33"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/78.157297"},{"issue":"12","key":"ref23","first-page":"128","article-title":"Wireless communications-principles and practice, (the book end)","volume":"45","author":"Rappaport","year":"2002","journal-title":"Microw. J."},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2020.3027491"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/10852379.pdf?arnumber=10852379","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,2,7]],"date-time":"2025-02-07T18:40:49Z","timestamp":1738953649000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10852379\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":24,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3533622","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2025]]}}}