{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,11]],"date-time":"2026-05-11T14:55:53Z","timestamp":1778511353178,"version":"3.51.4"},"reference-count":37,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"IC Design Education Center (IDEC), Korea"},{"name":"Science Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Science and ICT","award":["RS-2022-00165164"],"award-info":[{"award-number":["RS-2022-00165164"]}]},{"name":"Science Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Science and ICT","award":["RS-2022-00144419"],"award-info":[{"award-number":["RS-2022-00144419"]}]},{"name":"Science Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Science and ICT","award":["RS-2024-00408040"],"award-info":[{"award-number":["RS-2024-00408040"]}]},{"name":"Science Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Science and ICT","award":["2022M3F3A2A01072855"],"award-info":[{"award-number":["2022M3F3A2A01072855"]}]},{"DOI":"10.13039\/501100010418","name":"Institute of Information and Communications Technology Planning and Evaluation","doi-asserted-by":"publisher","award":["RS-2024-00347394"],"award-info":[{"award-number":["RS-2024-00347394"]}],"id":[{"id":"10.13039\/501100010418","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3533651","type":"journal-article","created":{"date-parts":[[2025,1,24]],"date-time":"2025-01-24T18:29:16Z","timestamp":1737743356000},"page":"1-8","source":"Crossref","is-referenced-by-count":2,"title":["A Light Detector Capacitance Compensation Technique Achieving Boosted Active Quenching for Single-Photon Avalanche Diodes"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0009-0005-3061-717X","authenticated-orcid":false,"given":"Sundo","family":"Kim","sequence":"first","affiliation":[{"name":"Graduate School of Science and Technology, Seoul National University, Seoul, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0001-6353-1074","authenticated-orcid":false,"given":"Jinseok","family":"Oh","sequence":"additional","affiliation":[{"name":"Department of Nuclear Power and Radiation Safety, Korea University of Science and Technology (UST), Daejeon, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0395-8076","authenticated-orcid":false,"given":"Dongsuk","family":"Jeon","sequence":"additional","affiliation":[{"name":"Department of Intelligence and Information, Research Institute for Convergence Science, Inter-University Semiconductor Research Center, Seoul National University, Seoul, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5902-8193","authenticated-orcid":false,"given":"Inyong","family":"Kwon","sequence":"additional","affiliation":[{"name":"Department of Radiological Science, Yonsei University, Wonju, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2883720"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2022.3207801"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/lssc.2020.3025625"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2020.2993722"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2023.3332941"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2022.3152324"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2020.3045204"},{"key":"ref8","first-page":"1","article-title":"A 67,392-SPAD PVTB-compensated multi-channel digital SiPM with 432 column-parallel 48 ps 17b TDCs for endoscopic time-of-flight PET","volume-title":"Proc. IEEE Int. Solid-State Circuits Conf. (ISSCC) Dig. Tech. Papers","author":"Carimatto"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JPHOT.2019.2952670"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2673002"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3054679"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3284953"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3155748"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2666458"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2014.2364703"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2011.2123090"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3328082"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2007.06.021"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/JQE.2013.2260726"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/JSTQE.2007.903854"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2010.2074213"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/LPT.2021.3124989"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/19.893251"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2003.813291"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2014.2338652"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.911691"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1002\/cta.2113"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/JSTQE.2018.2827669"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/NEWCAS50681.2021.9462754"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.nima.2014.12.049"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/j.nima.2018.10.205"},{"issue":"351","key":"ref32","first-page":"367","article-title":"Dependence of the input impedance of a three-electrode vacuum tube upon the load in the plate circuit","volume":"15","author":"Miller","year":"1920","journal-title":"Sci. Papers Bur. Standards"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/81.841925"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1016\/j.net.2024.03.006"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1063\/1.1136594"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/4.766813"},{"key":"ref37","first-page":"82","article-title":"Calculate oscillator jitter by using phase-noise analysis","volume":"2001","author":"Drakhlis","year":"2001","journal-title":"Microwaves"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/10852557.pdf?arnumber=10852557","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,2,8]],"date-time":"2025-02-08T05:48:06Z","timestamp":1738993686000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10852557\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":37,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3533651","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}