{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,20]],"date-time":"2026-05-20T08:38:20Z","timestamp":1779266300401,"version":"3.51.4"},"reference-count":39,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100018542","name":"Natural Science Foundation of Sichuan Province","doi-asserted-by":"publisher","award":["2023NSFSC0296"],"award-info":[{"award-number":["2023NSFSC0296"]}],"id":[{"id":"10.13039\/501100018542","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52207126"],"award-info":[{"award-number":["52207126"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"Joint Funds the National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["U22B6006"],"award-info":[{"award-number":["U22B6006"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3538074","type":"journal-article","created":{"date-parts":[[2025,2,13]],"date-time":"2025-02-13T18:35:16Z","timestamp":1739471716000},"page":"1-16","source":"Crossref","is-referenced-by-count":7,"title":["Fault Location and Protection for Metallic Return HVdc Grid Based on Natural Frequency Extraction of Modal Derivative Current"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-5965-7133","authenticated-orcid":false,"given":"Chunsheng","family":"Guo","sequence":"first","affiliation":[{"name":"College of Electrical Engineering, Sichuan University, Chengdu, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9690-8106","authenticated-orcid":false,"given":"Jianquan","family":"Liao","sequence":"additional","affiliation":[{"name":"College of Electrical Engineering, Sichuan University, Chengdu, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1156-1295","authenticated-orcid":false,"given":"Yuhong","family":"Wang","sequence":"additional","affiliation":[{"name":"College of Electrical Engineering, Sichuan University, Chengdu, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0002-2956-4494","authenticated-orcid":false,"given":"Wei","family":"Zhang","sequence":"additional","affiliation":[{"name":"College of Electrical Engineering, Sichuan University, Chengdu, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0008-5636-9700","authenticated-orcid":false,"given":"Yangtao","family":"Liu","sequence":"additional","affiliation":[{"name":"College of Electrical Engineering, Sichuan University, Chengdu, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0006-5431-1068","authenticated-orcid":false,"given":"Hongyu","family":"Wang","sequence":"additional","affiliation":[{"name":"State Grid Jibei Marketing Service Center, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8486-3679","authenticated-orcid":false,"given":"Dachuan","family":"Yu","sequence":"additional","affiliation":[{"name":"College of Automation and Electronic Engineering, Qingdao University of Science and Technology, Qingdao, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2023.109255"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/tpwrd.2019.2954599"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.23919\/cjee.2021.000018"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tpwrd.2023.3286863"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2022.3212037"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/tpwrd.2023.3282873"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2023.3262570"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2023.3279230"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/access.2019.2936276"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2017.12.010"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3271735"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2022.108864"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2023.108993"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3050380"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3172752"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2020.3013755"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2017.2756831"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2023.109037"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2020.2976721"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2019.2922944"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3227610"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3076569"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3139245"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRS.2017.2749141"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.17775\/CSEEJPES.2020.06730"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2020.2984609"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2022.3144300"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2021.3068800"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.23919\/EPE20ECCEEurope43536.2020.9215598"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2021.3138367"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3149339"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/ICPST61417.2024.10602051"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/j.isatra.2022.05.037"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.35833\/MPCE.2021.000435"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2023.109199"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2018.2874817"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2016.11.010"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2020.3024818"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2014.2364547"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/10887045.pdf?arnumber=10887045","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,2,20]],"date-time":"2025-02-20T20:12:47Z","timestamp":1740082367000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10887045\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":39,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3538074","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}