{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,9]],"date-time":"2026-06-09T18:27:28Z","timestamp":1781029648798,"version":"3.54.1"},"reference-count":36,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3541692","type":"journal-article","created":{"date-parts":[[2025,2,13]],"date-time":"2025-02-13T18:35:16Z","timestamp":1739471716000},"page":"1-14","source":"Crossref","is-referenced-by-count":7,"title":["YOLO\u2013DTAD: Dynamic Task Alignment Detection Model for Multicategory Power Defects Image"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-3759-4175","authenticated-orcid":false,"given":"Runhai","family":"Jiao","sequence":"first","affiliation":[{"name":"School of Control and Computer Engineering, North China Electric Power University, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5703-0209","authenticated-orcid":false,"given":"Jiaji","family":"Liu","sequence":"additional","affiliation":[{"name":"School of Control and Computer Engineering, North China Electric Power University, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7872-7400","authenticated-orcid":false,"given":"Kaihang","family":"Li","sequence":"additional","affiliation":[{"name":"School of Control and Computer Engineering, North China Electric Power University, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0004-7476-9274","authenticated-orcid":false,"given":"Ruojiao","family":"Qiao","sequence":"additional","affiliation":[{"name":"School of Control and Computer Engineering, North China Electric Power University, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0004-5626-642X","authenticated-orcid":false,"given":"Yanzhi","family":"Liu","sequence":"additional","affiliation":[{"name":"Smart Distribution Network Center, State Grid Jibei Electric Power Company Ltd., Qinhuangdao, Hebei, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6358-3109","authenticated-orcid":false,"given":"Wenbiao","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Control and Computer Engineering, North China Electric Power University, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2024.3450185"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2024.3449801"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2021.3116489"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1049\/gtd2.12916"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2024.3385817"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.3390\/electronics12153210"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2024.3381693"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2024.3418082"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2024.3375300"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2024.3381713"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3194909"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2022.3202958"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3318688"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2022.3213598"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.3390\/app12189314"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2019.00660"},{"key":"ref17","volume-title":"Ultralytics YOLO (Version 8.0. 0)[Computer Software]","author":"Jocher","year":"2023"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2020.3032166"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV48922.2021.00349"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1007\/s00591-010-0080-8"},{"key":"ref21","first-page":"1195","article-title":"Mean teachers are better role models: Weight-averaged consistency targets improve semi-supervised deep learning results","volume-title":"Proc. 31st Int. Conf. Neural Inf. Process. Syst.","author":"Tarvainen"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.patcog.2024.110714"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.48550\/arXiv.1906.07155"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2021.3119563"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2018.2871750"},{"key":"ref26","volume-title":"VPMBGI: Vietnamese Public Merged Dataset of Broken Glass Insulator for UAV Inspection of Power Lines","year":"2023"},{"key":"ref27","article-title":"Insulator defect detection","author":"Lewis","year":"2021","journal-title":"IEEE Dataport"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2015.169"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00644"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2017.324"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR42600.2020.00978"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52733.2024.01605"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-031-72751-1_1"},{"key":"ref34","article-title":"YOLOv10: Real-time end-to-end object detection","author":"Wang","year":"2024","journal-title":"arXiv:2405.14458"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2017.74"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/IJCNN48605.2020.9206626"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/10884832.pdf?arnumber=10884832","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,2,22]],"date-time":"2025-02-22T05:51:25Z","timestamp":1740203485000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10884832\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":36,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3541692","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}