{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,25]],"date-time":"2025-12-25T01:26:03Z","timestamp":1766625963542,"version":"3.38.0"},"reference-count":40,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62273354","62227814"],"award-info":[{"award-number":["62273354","62227814"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100016081","name":"Scientific Innovation Foundation of the Higher Education Institutions of Shanxi Province","doi-asserted-by":"publisher","award":["2022L434"],"award-info":[{"award-number":["2022L434"]}],"id":[{"id":"10.13039\/501100016081","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3541712","type":"journal-article","created":{"date-parts":[[2025,2,13]],"date-time":"2025-02-13T18:35:16Z","timestamp":1739471716000},"page":"1-14","source":"Crossref","is-referenced-by-count":2,"title":["Semisupervised Kernel Independent Component Analysis and Its Application for Fault Diagnosis"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-2084-7826","authenticated-orcid":false,"given":"Xiangyu","family":"Kong","sequence":"first","affiliation":[{"name":"High-Tech Institute of Xi’an, Xi’an, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0219-3056","authenticated-orcid":false,"given":"Meizhi","family":"Liu","sequence":"additional","affiliation":[{"name":"High-Tech Institute of Xi’an, Xi’an, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4541-420X","authenticated-orcid":false,"given":"Qi","family":"Zhang","sequence":"additional","affiliation":[{"name":"High-Tech Institute of Xi’an, Xi’an, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3453-2286","authenticated-orcid":false,"given":"Jiayu","family":"Luo","sequence":"additional","affiliation":[{"name":"High-Tech Institute of Xi’an, Xi’an, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0001-1310-8390","authenticated-orcid":false,"given":"Chen","family":"Zhang","sequence":"additional","affiliation":[{"name":"High-Tech Institute of Xi’an, Xi’an, China"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1016\/j.measurement.2024.114191"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1109\/TIM.2023.3238692"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1109\/ICMA52036.2021.9512658"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/TASE.2023.3279575"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1109\/TII.2022.3182774"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1109\/TII.2016.2571680"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1109\/TIM.2019.2954151"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1109\/TIM.2022.3218551"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1109\/TII.2019.2941486"},{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1007\/s42417-022-00725-3"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1109\/TIM.2020.3034975"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1109\/TCST.2021.3094512"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1109\/TII.2022.3182023"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1109\/TII.2019.2900226"},{"doi-asserted-by":"publisher","key":"ref15","DOI":"10.1109\/TIM.2023.3280492"},{"doi-asserted-by":"publisher","key":"ref16","DOI":"10.1109\/TIE.2018.2811358"},{"doi-asserted-by":"publisher","key":"ref17","DOI":"10.1109\/TII.2018.2841658"},{"doi-asserted-by":"publisher","key":"ref18","DOI":"10.1109\/TII.2018.2871515"},{"doi-asserted-by":"publisher","key":"ref19","DOI":"10.1109\/TIE.2022.3210588"},{"doi-asserted-by":"publisher","key":"ref20","DOI":"10.1002\/aic.690440812"},{"doi-asserted-by":"publisher","key":"ref21","DOI":"10.1021\/ie901939n"},{"doi-asserted-by":"publisher","key":"ref22","DOI":"10.1016\/j.conengprac.2013.06.008"},{"doi-asserted-by":"publisher","key":"ref23","DOI":"10.1016\/j.conengprac.2019.01.013"},{"doi-asserted-by":"publisher","key":"ref24","DOI":"10.1016\/j.jprocont.2021.07.008"},{"doi-asserted-by":"publisher","key":"ref25","DOI":"10.1016\/j.jfranklin.2022.02.035"},{"doi-asserted-by":"publisher","key":"ref26","DOI":"10.1016\/j.conengprac.2021.105008"},{"doi-asserted-by":"publisher","key":"ref27","DOI":"10.1109\/TCST.2013.2283925"},{"doi-asserted-by":"publisher","key":"ref28","DOI":"10.1016\/j.jprocont.2019.09.005"},{"doi-asserted-by":"publisher","key":"ref29","DOI":"10.1002\/cjce.5450850414"},{"doi-asserted-by":"publisher","key":"ref30","DOI":"10.1016\/S0893-6080(00)00026-5"},{"doi-asserted-by":"publisher","key":"ref31","DOI":"10.1016\/j.ifacol.2015.09.593"},{"doi-asserted-by":"publisher","key":"ref32","DOI":"10.1016\/j.ces.2003.09.012"},{"doi-asserted-by":"publisher","key":"ref33","DOI":"10.1109\/72.788641"},{"doi-asserted-by":"publisher","key":"ref34","DOI":"10.1007\/s00158-009-0460-7"},{"doi-asserted-by":"publisher","key":"ref35","DOI":"10.1109\/TR.2021.3139539"},{"doi-asserted-by":"publisher","key":"ref36","DOI":"10.1109\/TASE.2018.2873098"},{"doi-asserted-by":"publisher","key":"ref37","DOI":"10.1109\/TMAG.2015.2483521"},{"doi-asserted-by":"publisher","key":"ref38","DOI":"10.1016\/j.jprocont.2019.04.009"},{"doi-asserted-by":"publisher","key":"ref39","DOI":"10.1002\/0471221317"},{"doi-asserted-by":"publisher","key":"ref40","DOI":"10.1109\/TNN.2006.880980"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/10884936.pdf?arnumber=10884936","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,2,26]],"date-time":"2025-02-26T18:53:54Z","timestamp":1740596034000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10884936\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":40,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3541712","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2025]]}}}