{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,21]],"date-time":"2026-05-21T18:11:58Z","timestamp":1779387118437,"version":"3.53.1"},"reference-count":18,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100012166","name":"National Key Research and Development Program of China: BTIT","doi-asserted-by":"publisher","award":["2022YFF1202800"],"award-info":[{"award-number":["2022YFF1202800"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3541790","type":"journal-article","created":{"date-parts":[[2025,2,13]],"date-time":"2025-02-13T18:35:16Z","timestamp":1739471716000},"page":"1-11","source":"Crossref","is-referenced-by-count":2,"title":["One New Designed Wiener Filter Method for SQUID Magnetogastrogram Detection"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-1029-2778","authenticated-orcid":false,"given":"Hua","family":"Li","sequence":"first","affiliation":[{"name":"National Key Laboratory of Materials for Integrated Circuits, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0008-1088-2840","authenticated-orcid":false,"given":"Mingyue","family":"Zhang","sequence":"additional","affiliation":[{"name":"National Key Laboratory of Materials for Integrated Circuits, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/tbme.2018.2837647"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/10.775406"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/978-94-007-6561-0_9"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1111\/nmo.12780"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1152\/ajpgi.00054.2007"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/tbme.2009.2024087"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/PROC.1975.10036"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/BF02534144"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2024.3411130"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2022.3149002"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2775358"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TNN.2002.806624"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1162\/089976603765202677"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3014033"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2006.882115"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3324345"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/78.554307"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TASC.2016.2569507"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/10884810.pdf?arnumber=10884810","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,2,26]],"date-time":"2025-02-26T18:54:17Z","timestamp":1740596057000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10884810\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3541790","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}