{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,11]],"date-time":"2025-10-11T07:49:20Z","timestamp":1760168960860,"version":"3.38.0"},"reference-count":33,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100012166","name":"National Key Research and Development Program of China","doi-asserted-by":"publisher","award":["2022YFF0604600"],"award-info":[{"award-number":["2022YFF0604600"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3542872","type":"journal-article","created":{"date-parts":[[2025,2,18]],"date-time":"2025-02-18T18:20:04Z","timestamp":1739902804000},"page":"1-16","source":"Crossref","is-referenced-by-count":1,"title":["A Calibration Method for Spatial Resolution of Magnetic Probes Using a TEM Cell-Excited Slotted Rectangular Waveguide in Evanescent Mode"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-4491-7673","authenticated-orcid":false,"given":"Yuntao","family":"Jin","sequence":"first","affiliation":[{"name":"Key Laboratory of Electromagnetic Environmental Adaptability Measurements, Ministry of Education, Beihang University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0045-980X","authenticated-orcid":false,"given":"Fei","family":"Dai","sequence":"additional","affiliation":[{"name":"Key Laboratory of Electromagnetic Environmental Adaptability Measurements, Ministry of Education, Beihang University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4078-1641","authenticated-orcid":false,"given":"Lingnan","family":"Song","sequence":"additional","affiliation":[{"name":"Key Laboratory of Electromagnetic Environmental Adaptability Measurements, Ministry of Education, Beihang University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9482-9319","authenticated-orcid":false,"given":"Xingye","family":"Chen","sequence":"additional","affiliation":[{"name":"Key Laboratory of Electromagnetic Environmental Adaptability Measurements, Ministry of Education, Beihang University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4166-7306","authenticated-orcid":false,"given":"Chen","family":"Jiao","sequence":"additional","affiliation":[{"name":"Key Laboratory of Electromagnetic Environmental Adaptability Measurements, Ministry of Education, Beihang University, Beijing, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2017.2669301"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2866300"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2021.3089906"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/22.701442"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2014.2373472"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TAP.2019.2927814"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ICMSP58539.2023.10170996"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ICSAE.2016.7810152"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/IWS55252.2022.9977862"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2869181"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/LMWT.2022.3229498"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2013.2288089"},{"volume-title":"Integrated Circuits Measurement of Electromagnetic Emissions, 150 kHz to 1 GHz, Part 6: Measurement of Conducted Emissions\u2014Magnetic Probe Method","year":"2002","key":"ref13"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TAP.2016.2606556"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/IEEE-IWS.2019.8804150"},{"volume-title":"IEEE Standard for Calibration of Electromagnetic Field Sensors and Probes (Excluding Antennas) From 9 KHz To 40 GHz","year":"2013","key":"ref16"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/RWS.2011.5725457"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/nemo.2017.7964195"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/EMCEurope57790.2023.10274283"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.23919\/MIPRO55190.2022.9803419"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1002\/047164465X"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1002\/mmce.21958"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1117\/1.JATIS.7.3.035008"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.wavemoti.2016.09.012"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.3390\/sym12071063"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2681282"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ISEMC.2004.1349815"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1002\/j.1538-7305.1969.tb04274.x"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1002\/9780470290996"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2004.839303"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1049\/piee.1964.0320"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.1971.1127503"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.1974.303364"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/10891930.pdf?arnumber=10891930","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,3,1]],"date-time":"2025-03-01T06:01:47Z","timestamp":1740808907000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10891930\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":33,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3542872","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2025]]}}}