{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,18]],"date-time":"2025-12-18T14:29:13Z","timestamp":1766068153295,"version":"3.38.0"},"reference-count":36,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62331019"],"award-info":[{"award-number":["62331019"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3544369","type":"journal-article","created":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T18:39:51Z","timestamp":1740163191000},"page":"1-15","source":"Crossref","is-referenced-by-count":2,"title":["Separation and Parameter Measurement of Compound Intermittent Sampling Repeater Jamming Based on AE-YOLOv8"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-2240-8459","authenticated-orcid":false,"given":"Yaojun","family":"Wu","sequence":"first","affiliation":[{"name":"School of Information Mechanics and Sensing Engineering, Xidian University, Xi’an, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0007-5846-849X","authenticated-orcid":false,"given":"Liang","family":"Huang","sequence":"additional","affiliation":[{"name":"Hangzhou Institute of Technology, Xidian University, Hangzhou, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5212-9760","authenticated-orcid":false,"given":"Zhixing","family":"Liu","sequence":"additional","affiliation":[{"name":"School of Information Mechanics and Sensing Engineering, Xidian University, Xi’an, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0114-7077","authenticated-orcid":false,"given":"Minghui","family":"Sha","sequence":"additional","affiliation":[{"name":"Beijing Institute of Radio Measurement, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2941-3357","authenticated-orcid":false,"given":"Liming","family":"Zhou","sequence":"additional","affiliation":[{"name":"National Key Laboratory of Electromagnetic Space Security, Chengdu, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6541-9441","authenticated-orcid":false,"given":"Yinghui","family":"Quan","sequence":"additional","affiliation":[{"name":"School of Information Mechanics and Sensing Engineering, Xidian University, Xi’an, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2024.3421440"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2024.3428644"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2024.3432141"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/7.395232"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ICIMW.2009.5324673"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.3390\/s19153279"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/Radar53847.2021.10028648"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.3390\/rs15143673"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/CISAI54367.2021.00122"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2022.3159561"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ITC-Egypt58155.2023.10206342"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1049\/iet-rsn.2017.0114"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1049\/iet-rsn.2018.5658"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ICSIDP47821.2019.9173164"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.3390\/s21248277"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ACES-China56081.2022.10065322"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/LSP.2024.3358751"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2021.3129645"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/IMCEC51613.2021.9481990"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TAES.2022.3224695"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/Radar53847.2021.10028548"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1049\/el:19931450"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1137\/0513033"},{"volume-title":"The Gamma Function","year":"2015","author":"Artin","key":"ref24"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ICOASE56293.2022.10075607"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3322998"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1007\/s11263-007-0090-8"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.91"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2019.00925"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/CVPRW50498.2020.00203"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/j.neunet.2017.12.012"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2015.2389824"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00913"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2017.106"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1016\/0734-189X(88)90022-9"},{"key":"ref36","article-title":"A review on deep learning techniques applied to semantic segmentation","author":"Garcia-Garcia","year":"2017","journal-title":"arXiv:1704.06857"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/10898066.pdf?arnumber=10898066","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,3,11]],"date-time":"2025-03-11T17:36:46Z","timestamp":1741714606000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10898066\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":36,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3544369","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2025]]}}}