{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,16]],"date-time":"2026-06-16T04:05:55Z","timestamp":1781582755507,"version":"3.54.5"},"reference-count":33,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"NSF China","award":["62173058"],"award-info":[{"award-number":["62173058"]}]},{"name":"NSF China","award":["62327807"],"award-info":[{"award-number":["62327807"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3545165","type":"journal-article","created":{"date-parts":[[2025,2,24]],"date-time":"2025-02-24T18:36:53Z","timestamp":1740422213000},"page":"1-14","source":"Crossref","is-referenced-by-count":1,"title":["Noninvasive Stereoscopic Backlight Imaging Design for In Situ Measurement of Particle Size Distribution During Continuous Crystallization via COBC"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-0509-7780","authenticated-orcid":false,"given":"Ji","family":"Fan","sequence":"first","affiliation":[{"name":"Institute of Advanced Measurement and Control Technology, Dalian University of Technology, Dalian, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1243-4546","authenticated-orcid":false,"given":"Tao","family":"Liu","sequence":"additional","affiliation":[{"name":"Institute of Advanced Measurement and Control Technology, Dalian University of Technology, Dalian, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1327-1603","authenticated-orcid":false,"given":"Yongcan","family":"Shuang","sequence":"additional","affiliation":[{"name":"Institute of Advanced Measurement and Control Technology, Dalian University of Technology, Dalian, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0008-8336-4446","authenticated-orcid":false,"given":"Mingyan","family":"Zhao","sequence":"additional","affiliation":[{"name":"Institute of Advanced Measurement and Control Technology, Dalian University of Technology, Dalian, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0006-9630-8457","authenticated-orcid":false,"given":"Haibo","family":"Niu","sequence":"additional","affiliation":[{"name":"Institute of Advanced Measurement and Control Technology, Dalian University of Technology, Dalian, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9994-839X","authenticated-orcid":false,"given":"Junghui","family":"Chen","sequence":"additional","affiliation":[{"name":"Department of Chemical Engineering, Chung-Yuan Christian University, Taoyuan, Taiwan"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0930-6623","authenticated-orcid":false,"given":"Yonghong","family":"Tan","sequence":"additional","affiliation":[{"name":"College of Information, Mechanical and Electrical Engineering, Shanghai Normal University, Shanghai, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1021\/acs.oprd.9b00362"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.jiec.2017.06.009"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1021\/acs.oprd.5b00206"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.ces.2012.02.013"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejpb.2013.03.032"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1021\/acs.oprd.5b00127"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijpharm.2022.122172"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.cjche.2018.11.011"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1002\/aic.16145"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1021\/acs.cgd.9b01313"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2006.887039"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.ces.2016.03.039"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1021\/cg200560b"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1039\/c2ce06628a"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1002\/ceat.201600276"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1021\/acs.cgd.8b00371"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1021\/acs.iecr.9b05828"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.powtec.2021.09.011"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1021\/acs.cgd.1c01019"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.cherd.2021.12.001"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3277130"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1021\/acs.oprd.1c00136"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.powtec.2022.118077"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3330217"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52688.2022.00135"},{"key":"ref26","volume-title":"Labelme v5.2.0","year":"2023"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.3390\/info11020125"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1007\/s11042-020-08976-6"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.imavis.2022.104401"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1364\/AO.49.005501"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2018.06.022"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/YAC63405.2024.10598478"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1609\/aaai.v35i3.16374"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/10902088.pdf?arnumber=10902088","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,3,11]],"date-time":"2025-03-11T17:33:58Z","timestamp":1741714438000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10902088\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":33,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3545165","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}