{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,6]],"date-time":"2026-07-06T09:35:15Z","timestamp":1783330515663,"version":"3.54.6"},"reference-count":40,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"National Key Research and Development Program of China","award":["2022YFB3403302"],"award-info":[{"award-number":["2022YFB3403302"]}]},{"name":"National Key Research and Development Program of China","award":["2019YFA0706701"],"award-info":[{"award-number":["2019YFA0706701"]}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52175477"],"award-info":[{"award-number":["52175477"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["U22A20176"],"award-info":[{"award-number":["U22A20176"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3545205","type":"journal-article","created":{"date-parts":[[2025,3,5]],"date-time":"2025-03-05T18:44:44Z","timestamp":1741200284000},"page":"1-13","source":"Crossref","is-referenced-by-count":4,"title":["Profile-Aided Subaperture Stitching Algorithm for the Measurement of Microlens Array Optics by Coherence Scanning Interferometry"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0009-0006-7581-2742","authenticated-orcid":false,"given":"Jun","family":"Guo","sequence":"first","affiliation":[{"name":"Institute of Intelligent Manufacturing and Information Engineering, School of Mechanical Engineering, Shanghai Jiao Tong University, Shanghai, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1281-3637","authenticated-orcid":false,"given":"Yijun","family":"Shen","sequence":"additional","affiliation":[{"name":"Institute of Intelligent Manufacturing and Information Engineering, School of Mechanical Engineering, Shanghai Jiao Tong University, Shanghai, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5632-3146","authenticated-orcid":false,"given":"Xi","family":"Wang","sequence":"additional","affiliation":[{"name":"Institute of Intelligent Manufacturing and Information Engineering, School of Mechanical Engineering, Shanghai Jiao Tong University, Shanghai, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0005-8983-3221","authenticated-orcid":false,"given":"Lingwen","family":"Tan","sequence":"additional","affiliation":[{"name":"Institute of Intelligent Manufacturing and Information Engineering, School of Mechanical Engineering, Shanghai Jiao Tong University, Shanghai, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0776-3716","authenticated-orcid":false,"given":"Rong","family":"Su","sequence":"additional","affiliation":[{"name":"Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8796-5355","authenticated-orcid":false,"given":"Mingjun","family":"Ren","sequence":"additional","affiliation":[{"name":"Institute of Intelligent Manufacturing and Information Engineering, School of Mechanical Engineering, Shanghai Jiao Tong University, Shanghai, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1117\/12.771213"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1364\/oe.14.010469"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/mmul.2012.42"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.optmat.2018.03.003"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1364\/ao.57.007296"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1364\/ao.55.006947"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijmachtools.2020.103673"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.precisioneng.2022.06.001"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-12012-1"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1364\/aop.7.000001"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1364\/oft.2012.otu1d.4"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1088\/2051-672X\/3\/2\/023001"},{"key":"ref13","first-page":"1587","article-title":"Subaperture test of a large flat or a fast aspheric surface","volume":"71","author":"Kin","year":"1981","journal-title":"J. Opt. Soc. Amer."},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1364\/AO.402543"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1364\/AO.511942"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1117\/12.795094"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1364\/AO.433312"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1117\/12.2246149"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.optcom.2022.128278"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1364\/oe.486829"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.optcom.2016.12.067"},{"key":"ref22","doi-asserted-by":"crossref","first-page":"99","DOI":"10.1016\/j.precisioneng.2017.04.017","article-title":"A Gaussian process and image registration based stitching method for high dynamic range measurement of precision surfaces","volume":"50","author":"Liu","year":"2017","journal-title":"Precis. Eng."},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2019.105974"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/ROBOT.1991.132043"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1117\/12.57955"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3156205"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2024.3413191"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2013.184"},{"key":"ref29","first-page":"59","article-title":"Efficient surfel-based SLAM using 3D laser range data in urban environments","volume-title":"Robotics: Science and Systems","volume":"14","author":"Behley","year":"2018"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/IEEECONF49454.2021.9382647"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/IM.2001.924423"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1007\/s10514-013-9327-2"},{"key":"ref33","doi-asserted-by":"crossref","first-page":"161","DOI":"10.7551\/mitpress\/8727.003.0022","article-title":"Generalized-ICP","volume-title":"Robotics: Science and Systems","volume":"5","author":"Segal","year":"2010"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/ICPR.2002.1047997"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3309384"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/ICRA.2019.8793791"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1364\/oe.25.009393"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1364\/OE.26.009882"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1007\/s001380050048"},{"issue":"10","key":"ref40","first-page":"1","article-title":"Linear least-squares optimization for point-to-plane icp surface registration","volume":"4","author":"Low","year":"2004"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/10912692.pdf?arnumber=10912692","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,3,24]],"date-time":"2025-03-24T18:06:54Z","timestamp":1742839614000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10912692\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":40,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3545205","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}