{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,12]],"date-time":"2025-09-12T19:49:16Z","timestamp":1757706556657,"version":"3.38.0"},"reference-count":27,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62301355"],"award-info":[{"award-number":["62301355"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3545521","type":"journal-article","created":{"date-parts":[[2025,2,25]],"date-time":"2025-02-25T18:47:18Z","timestamp":1740509238000},"page":"1-9","source":"Crossref","is-referenced-by-count":1,"title":["Wideband Ultrasound Tomography System for Real-Time Monitoring of Multiphase Flow"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-5146-4807","authenticated-orcid":false,"given":"Chao","family":"Tan","sequence":"first","affiliation":[{"name":"Tianjin Key Laboratory of Process Measurement and Control, School of Electrical and Information Engineering, Tianjin University, Tianjin, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0003-8674-7032","authenticated-orcid":false,"given":"Qingze","family":"Li","sequence":"additional","affiliation":[{"name":"Tianjin Key Laboratory of Process Measurement and Control, School of Electrical and Information Engineering, Tianjin University, Tianjin, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1345-9593","authenticated-orcid":false,"given":"Yong","family":"Bao","sequence":"additional","affiliation":[{"name":"Tianjin Key Laboratory of Process Measurement and Control, School of Electrical and Information Engineering, Tianjin University, Tianjin, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8478-8928","authenticated-orcid":false,"given":"Feng","family":"Dong","sequence":"additional","affiliation":[{"name":"Tianjin Key Laboratory of Process Measurement and Control, School of Electrical and Information Engineering, Tianjin University, Tianjin, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.3390\/s22062309"},{"volume-title":"Industrial Tomography","year":"2022","author":"Wang","key":"ref2"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.cej.2012.02.028"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2923864"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2024.3367878"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijthermalsci.2023.108536"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2024.3400350"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3309361"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.flowmeasinst.2016.05.001"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/T-UFFC.1986.26833"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/58.764834"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/S0009-2509(97)00043-2"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.flowmeasinst.2014.10.014"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3271756"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2022.3221218"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1121\/10.0009923"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TUFFC.2020.3020361"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3049541"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3303529"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.csite.2023.103176"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/ac6e2d"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/abbebd"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.laa.2017.02.028"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2010.2100850"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3346538"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3037950"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2023.3342097"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/10902531.pdf?arnumber=10902531","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,3,11]],"date-time":"2025-03-11T17:34:53Z","timestamp":1741714493000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10902531\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":27,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3545521","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2025]]}}}