{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,10]],"date-time":"2026-07-10T16:35:10Z","timestamp":1783701310062,"version":"3.55.0"},"reference-count":33,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62271148"],"award-info":[{"award-number":["62271148"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3545538","type":"journal-article","created":{"date-parts":[[2025,2,25]],"date-time":"2025-02-25T18:47:18Z","timestamp":1740509238000},"page":"1-13","source":"Crossref","is-referenced-by-count":5,"title":["Multidirectional Stereo Vision Sensor With Catadioptric Units for Measuring Geometric Parameters of Pipeline Inner Walls"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0009-0000-2424-6812","authenticated-orcid":false,"given":"Wentao","family":"Guo","sequence":"first","affiliation":[{"name":"School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9341-9342","authenticated-orcid":false,"given":"Fuqiang","family":"Zhou","sequence":"additional","affiliation":[{"name":"School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8939-0452","authenticated-orcid":false,"given":"Haishu","family":"Tan","sequence":"additional","affiliation":[{"name":"School of Physics and Optoelectronic Engineering, Foshan University, Foshan, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0003-7983-9131","authenticated-orcid":false,"given":"Peiran","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6320-1657","authenticated-orcid":false,"given":"Zhipeng","family":"Song","sequence":"additional","affiliation":[{"name":"School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0001-8450-0461","authenticated-orcid":false,"given":"Kexin","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.3390\/s19112548"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.3390\/infrastructures4010010"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2022.110895"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.petrol.2018.02.070"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1134\/S1061830919030069"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.3390\/s16030298"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.3390\/app13127107"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1177\/1475921717745000"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/acf14b"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2016.2514758"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.3390\/jmse11071459"},{"key":"ref12","first-page":"113761","article-title":"Metamaterial-based amplification of multi-mode ultrasonic guided waves toward improved damage detection in pipelines","volume-title":"Proc. SPIE","volume":"11376","author":"Danawe"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2022.111302"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2020.107624"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.3390\/s21144680"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.3040396"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ICSIPA.2015.7412164"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ICIEA.2016.7603726"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.autcon.2022.104285"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.autcon.2023.104864"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2023.108003"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2022.111794"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlastec.2023.109313"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1063\/5.0058223"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijleo.2019.05.060"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2012.10.031"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2014.2328339"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.3788\/aos201838.0815003"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2021.106786"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/ad6922"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.1999.791289"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/34.659930"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1137\/0111030"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/10902450.pdf?arnumber=10902450","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,3,18]],"date-time":"2025-03-18T17:33:50Z","timestamp":1742319230000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10902450\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":33,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3545538","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}