{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,11]],"date-time":"2026-06-11T16:02:30Z","timestamp":1781193750178,"version":"3.54.1"},"reference-count":29,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52378311"],"award-info":[{"award-number":["52378311"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3547464","type":"journal-article","created":{"date-parts":[[2025,3,3]],"date-time":"2025-03-03T13:30:15Z","timestamp":1741008615000},"page":"1-12","source":"Crossref","is-referenced-by-count":4,"title":["A Novel Multiparameter RFID Sensing Characteristic Study Using Varactor Diode and Digital Control Coding Method"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-8659-6938","authenticated-orcid":false,"given":"Yaming","family":"Xie","sequence":"first","affiliation":[{"name":"Department of Electronic Science and Technology, Tongji University, Shanghai, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0009-0657-1422","authenticated-orcid":false,"given":"Jiuyi","family":"Hao","sequence":"additional","affiliation":[{"name":"Department of Electronic Science and Technology, Tongji University, Shanghai, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6754-0720","authenticated-orcid":false,"given":"Zhichong","family":"Wan","sequence":"additional","affiliation":[{"name":"Department of Electronic Science and Technology, Tongji University, Shanghai, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0521-1176","authenticated-orcid":false,"given":"Guochun","family":"Wan","sequence":"additional","affiliation":[{"name":"Department of Electronic Science and Technology, Tongji University, Shanghai, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5777-0645","authenticated-orcid":false,"given":"Liyu","family":"Xie","sequence":"additional","affiliation":[{"name":"Department of Disaster Mitigation for Structures, Tongji University, Shanghai, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/jiot.2017.2664072"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/tuffc.2014.006556"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2016.2636451"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1177\/1475921706057982"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.3390\/s21072525"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2015.7151231"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1088\/0964-1726\/22\/8\/085009"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1088\/0964-1726\/12\/2\/307"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.23919\/ISAP47053.2021.9391422"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2015.2453947"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2018.2831903"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2017.2786696"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2024.3379581"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TAP.2013.2292520"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2015.2507406"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2022.3157532"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2949520"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2022.3196740"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.3390\/s22166027"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2024.3398133"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2011.2171001"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2022.3221938"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3306820"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TAP.2018.2879854"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/LAWP.2014.2332449"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1002\/stc.2855"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3056132"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2022.3229467"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3161718"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/10909269.pdf?arnumber=10909269","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,2,12]],"date-time":"2026-02-12T20:58:49Z","timestamp":1770929929000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10909269\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":29,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3547464","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}