{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,15]],"date-time":"2026-05-15T15:49:49Z","timestamp":1778860189666,"version":"3.51.4"},"reference-count":40,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Fundamental Research Funds for the Central Universities through the \u201cChangjiang Scholars\u201d Research Supporting Fund Project of the Chinese Ministry of Education"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3548244","type":"journal-article","created":{"date-parts":[[2025,3,5]],"date-time":"2025-03-05T18:44:44Z","timestamp":1741200284000},"page":"1-14","source":"Crossref","is-referenced-by-count":3,"title":["Evaluation Method for Tripping Probability of Sensitive Equipment Under Voltage Sag Based on Energy Loss Diagram"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-2687-7524","authenticated-orcid":false,"given":"Shunyi","family":"Li","sequence":"first","affiliation":[{"name":"College of Electrical Engineering, Sichuan University, Chengdu, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7682-8299","authenticated-orcid":false,"given":"Ying","family":"Wang","sequence":"additional","affiliation":[{"name":"College of Electrical Engineering, Sichuan University, Chengdu, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6551-6671","authenticated-orcid":false,"given":"Huaxi","family":"Yu","sequence":"additional","affiliation":[{"name":"College of Electrical Engineering, Sichuan University, Chengdu, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8962-8528","authenticated-orcid":false,"given":"Yunzhu","family":"Chen","sequence":"additional","affiliation":[{"name":"College of Electrical Engineering, Sichuan University, Chengdu, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0628-6444","authenticated-orcid":false,"given":"Wen","family":"Zhou","sequence":"additional","affiliation":[{"name":"Hebei Electric Power Research Institute, State Grid of China, Shijiazhuang, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2255-3584","authenticated-orcid":false,"given":"Shuyuan","family":"Zhang","sequence":"additional","affiliation":[{"name":"College of Electrical Engineering, Sichuan University, Chengdu, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2453-4018","authenticated-orcid":false,"given":"Qi","family":"Guo","sequence":"additional","affiliation":[{"name":"College of Electrical and Information Engineering, Hunan University, Changsha, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2013.2278996"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3218516"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2016.2593105"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2014.2355877"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2016.2633518"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2020.3006017"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ICPRE55555.2022.9960502"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1186\/s41601-016-0018-9"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2018.2885402"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2004.832353"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ICPRE.2017.8390551"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2018.2870086"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2004.837828"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2023.3243552"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2022.3175162"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2005.855447"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2018.2884562"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.35833\/MPCE.2019.000470"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2020.3041000"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2002.804016"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ICHQP61174.2024.10768842"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3127655"},{"key":"ref23","volume-title":"Testing and Measurement Techniques-Power Quality Measurement Methods","year":"2015"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/ieeestd.2014.6842577"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1049\/rpg2.12815"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2023.3302568"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2021.3053996"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2022.3198854"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2012.2197423"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2005.855626"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2022.3172131"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2010.2045770"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/ieeestd.2023.10146554"},{"key":"ref34","volume-title":"Voltage Dip Immunity of Equipment in Installations","year":"2010"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2012.2202204"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRS.2018.2856743"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/5289.975465"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1186\/s41601-016-0032-y"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/ieeestd.2014.6895236"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.3403\/30256018"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/10912762.pdf?arnumber=10912762","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,3,24]],"date-time":"2025-03-24T18:14:08Z","timestamp":1742840048000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10912762\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":40,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3548244","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}