{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,1]],"date-time":"2026-06-01T12:56:27Z","timestamp":1780318587023,"version":"3.54.1"},"reference-count":66,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100012166","name":"National Key Research and Development Program of China","doi-asserted-by":"publisher","award":["2021YFF0901304"],"award-info":[{"award-number":["2021YFF0901304"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3550210","type":"journal-article","created":{"date-parts":[[2025,3,11]],"date-time":"2025-03-11T17:35:18Z","timestamp":1741714518000},"page":"1-13","source":"Crossref","is-referenced-by-count":4,"title":["A Domain Incremental Learning Framework for PCB Continuous Defect Detection"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0009-0005-2532-2633","authenticated-orcid":false,"given":"Ze","family":"Yan","sequence":"first","affiliation":[{"name":"Department of Automation, Tsinghua University, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1799-8316","authenticated-orcid":false,"given":"Ruiyang","family":"Hao","sequence":"additional","affiliation":[{"name":"Department of Automation, Tsinghua University, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5600-7055","authenticated-orcid":false,"given":"Biqing","family":"Huang","sequence":"additional","affiliation":[{"name":"Department of Automation, Tsinghua University, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0004-8969-6960","authenticated-orcid":false,"given":"Lin","family":"Zhu","sequence":"additional","affiliation":[{"name":"AI Lab, Lenovo Research, Shenzhen, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4543-772X","authenticated-orcid":false,"given":"Hui","family":"Pan","sequence":"additional","affiliation":[{"name":"AI Lab, Lenovo Research, Shenzhen, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.jenvman.2013.10.003"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-022-06026-7"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1609\/aaai.v32i1.11651"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2017.368"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2017.587"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/WACV51458.2022.00214"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-020-01670-2"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmsy.2019.04.002"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1115\/1.4051077"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.aei.2022.101566"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/s40964-024-00576-2"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1115\/1.4063860"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmsy.2023.08.019"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCPMT.2018.2873744"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2019.2911062"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2021.115673"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.micpro.2020.103807"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1007\/s11554-023-01272-0"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ISESD.2016.7886753"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1007\/978-981-19-3590-9_3"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1108\/CW-07-2014-0027"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1049\/joe.2018.8270"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ICSP.2018.8652335"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/SDPC.2018.8664974"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2019.06.046"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.3390\/s22207971"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3153997"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ICMCCE51767.2020.00287"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/CSCWD49262.2021.9437846"},{"issue":"1","key":"ref30","first-page":"1","article-title":"Development of PCB defect detection system using image processing with YOLO CNN method","volume":"6","author":"Santoso","year":"2022","journal-title":"Int. J. Artif. Intell. Res."},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1049\/joe.2018.8275"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2022.3214306"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1049\/trit.2019.0019"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.3389\/fphy.2021.708097"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3201945"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3099566"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1038\/s42256-022-00568-3"},{"key":"ref38","first-page":"1","article-title":"Effect of scale on catastrophic forgetting in neural networks","volume-title":"Proc. Int. Conf. Learn. Represent.","author":"Ramasesh"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2024.3367329"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/ICME.2019.00009"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2017.2773081"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52688.2022.00718"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR46437.2021.00164"},{"key":"ref44","first-page":"1","article-title":"Gradient episodic memory for continual learning","volume-title":"Proc. Adv. Neural Inf. Process. Syst.","volume":"30","author":"Lopez-Paz"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2024.127483"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR46437.2021.00812"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-01252-6_33"},{"key":"ref48","first-page":"1023","article-title":"Improved schemes for episodic memory-based lifelong learning","volume-title":"Proc. Adv. Neural Inf. Process. Syst.","volume":"33","author":"Guo"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2015.169"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR46437.2021.00577"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52729.2023.02279"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52688.2022.00904"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52733.2024.02718"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1609\/aaai.v38i7.28537"},{"key":"ref55","first-page":"91","article-title":"Faster R-CNN: Towards real-time object detection with region proposal networks","volume-title":"Proc. Adv. Neural Inf. Process. Syst.","volume":"28","author":"Ren"},{"key":"ref56","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.90"},{"key":"ref57","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2009.5206848"},{"key":"ref58","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2021.3124133"},{"key":"ref59","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2019.00092"},{"key":"ref60","doi-asserted-by":"publisher","DOI":"10.1109\/ICASSP.2007.366913"},{"key":"ref61","doi-asserted-by":"publisher","DOI":"10.1049\/joe.2019.1183"},{"key":"ref62","article-title":"Online PCB defect detector on a new PCB defect dataset","author":"Tang","year":"2019","journal-title":"arXiv:1902.06197"},{"key":"ref63","volume-title":"YOLO Dataset","author":"Jain","year":"2021"},{"key":"ref64","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2019.00195"},{"key":"ref65","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-58565-5_41"},{"key":"ref66","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52688.2022.00921"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/10922142.pdf?arnumber=10922142","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,3,26]],"date-time":"2025-03-26T10:15:20Z","timestamp":1742984120000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10922142\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":66,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3550210","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}