{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,3]],"date-time":"2026-04-03T15:36:23Z","timestamp":1775230583902,"version":"3.50.1"},"reference-count":30,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62201125"],"award-info":[{"award-number":["62201125"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62371097"],"award-info":[{"award-number":["62371097"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100018542","name":"Natural Science Foundation of Sichuan Province","doi-asserted-by":"publisher","award":["2025ZNSFSC0527"],"award-info":[{"award-number":["2025ZNSFSC0527"]}],"id":[{"id":"10.13039\/501100018542","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3550213","type":"journal-article","created":{"date-parts":[[2025,3,11]],"date-time":"2025-03-11T17:35:18Z","timestamp":1741714518000},"page":"1-11","source":"Crossref","is-referenced-by-count":3,"title":["Real-Time Digital Background Calibration Technology for Integral Nonlinearity of Analog-to-Digital Converters"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-6890-9892","authenticated-orcid":false,"given":"Yu","family":"Zhao","sequence":"first","affiliation":[{"name":"School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0006-8754-9558","authenticated-orcid":false,"given":"Jinghao","family":"Chen","sequence":"additional","affiliation":[{"name":"School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9138-362X","authenticated-orcid":false,"given":"Jie","family":"Meng","sequence":"additional","affiliation":[{"name":"School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5802-465X","authenticated-orcid":false,"given":"Peng","family":"Ye","sequence":"additional","affiliation":[{"name":"Shenzhen Institute for Advanced Study, University of Electronic Science and Technology of China, Shenzhen, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1761-731X","authenticated-orcid":false,"given":"Kuojun","family":"Yang","sequence":"additional","affiliation":[{"name":"School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3102-7954","authenticated-orcid":false,"given":"Wuhuang","family":"Huang","sequence":"additional","affiliation":[{"name":"School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS45731.2020.9180833"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2004.836232"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2003.821279"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2011.2161026"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2014.2321163"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2013.6487736"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2013.2252518"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS51556.2021.9401172"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2021.3066886"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2010.2060222"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2013.2248289"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2006.884231"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2004.836863"},{"issue":"4","key":"ref14","first-page":"501","article-title":"Several approaches to ADC transfer function approximation and their application for ADC non-linearity correction","volume":"15","author":"Such\u00e1nek","year":"2008","journal-title":"Metrology Meas. Syst."},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/IDAACS.2009.5343008"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2023.3284224"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS48704.2020.9184523"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1063\/1.4869871"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.910106"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ieeestd.2023.10285677"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-006-0186-z"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.csi.2005.12.004"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2015.7169324"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/78.823976"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1017\/cbo9780511754661"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2013.2256234"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/MIM.2012.6365545"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/AUTEST.2012.6334521"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2004.840817"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/ICASSP.2012.6288690"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/10922147.pdf?arnumber=10922147","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,4,2]],"date-time":"2025-04-02T05:39:09Z","timestamp":1743572349000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10922147\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":30,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3550213","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}