{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,31]],"date-time":"2025-12-31T12:21:38Z","timestamp":1767183698514,"version":"3.40.3"},"reference-count":38,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"National Key Research and Development Program of China","award":["2022YFB3403302"],"award-info":[{"award-number":["2022YFB3403302"]}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52305546","52335010"],"award-info":[{"award-number":["52305546","52335010"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100002858","name":"China Postdoctoral Science Foundation","doi-asserted-by":"publisher","award":["2023M742252"],"award-info":[{"award-number":["2023M742252"]}],"id":[{"id":"10.13039\/501100002858","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"State Key Laboratory of Precision Measurement Technology and Instruments","doi-asserted-by":"publisher","award":["Pilab2412"],"award-info":[{"award-number":["Pilab2412"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3551429","type":"journal-article","created":{"date-parts":[[2025,3,14]],"date-time":"2025-03-14T17:47:01Z","timestamp":1741974421000},"page":"1-12","source":"Crossref","is-referenced-by-count":1,"title":["In Situ Coherence Scanning Interferometry Measurement System for Large-Scale Rotationally Symmetric Aspheric Surfaces"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-1281-3637","authenticated-orcid":false,"given":"Yijun","family":"Shen","sequence":"first","affiliation":[{"name":"School of Mechanical Engineering, Shanghai Jiao Tong University, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2250-849X","authenticated-orcid":false,"given":"Jiayu","family":"Liu","sequence":"additional","affiliation":[{"name":"School of Mechanical Engineering, Shanghai Jiao Tong University, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0004-6427-1931","authenticated-orcid":false,"given":"Jun","family":"Yang","sequence":"additional","affiliation":[{"name":"School of Mechanical Engineering, Shanghai Jiao Tong University, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7382-1836","authenticated-orcid":false,"given":"Duo","family":"Li","sequence":"additional","affiliation":[{"name":"School of Mechanical Engineering, Shanghai Jiao Tong University, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0776-3716","authenticated-orcid":false,"given":"Rong","family":"Su","sequence":"additional","affiliation":[{"name":"Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8796-5355","authenticated-orcid":false,"given":"Mingjun","family":"Ren","sequence":"additional","affiliation":[{"name":"School of Mechanical Engineering, Shanghai Jiao Tong University, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3194-6731","authenticated-orcid":false,"given":"Limin","family":"Zhu","sequence":"additional","affiliation":[{"name":"School of Mechanical Engineering, Shanghai Jiao Tong University, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1364\/AO.58.004176"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1117\/1.OE.52.6.061308"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.rinp.2023.107189"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1117\/12.2284100"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-019-03977-8"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/s12541-023-00869-6"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/s12541-021-00528-8"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.cirp.2019.05.005"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.cirp.2011.03.074"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1364\/OE.27.000212"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1117\/12.2677505"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1088\/2631-7990\/acc76e"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.cirp.2008.03.041"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.precisioneng.2007.01.003"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1063\/1.3529880"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.precisioneng.2011.07.011"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-016-9494-3"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.precisioneng.2021.11.015"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2017.12.038"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2023.113257"},{"article-title":"Integrated on-machine metrology systems","volume-title":"Proc. Int. Symp. Ultraprecis. Eng. Nanotechnol. (ISUPEN), Jpn. Soc. Precis. Eng. Semestrial Meeting JSPE Autumn Conf.","author":"King","key":"ref21"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2021.110311"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1364\/OE.488897"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.optcom.2020.126665"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1088\/978-0-7503-2528-8ch2"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1364\/AOP.7.000001"},{"key":"ref27","first-page":"20","article-title":"Optical form and relational metrology of aspheric micro optics","volume-title":"American Society for Precision Engineering","author":"Colonna de Lega","year":"2017"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1117\/12.3009730"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1007\/s11465-020-0602-6"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/ab4a48"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2020.106129"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.3390\/mi12080929"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2020.106015"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1364\/OFT.2019.OM4A.2"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6633\/ab092d"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-12012-1_9"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2020.107523"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1145\/357994.358023"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/10927630.pdf?arnumber=10927630","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,3,31]],"date-time":"2025-03-31T23:34:38Z","timestamp":1743464078000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10927630\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":38,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3551429","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2025]]}}}