{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,30]],"date-time":"2026-01-30T00:27:48Z","timestamp":1769732868401,"version":"3.49.0"},"reference-count":36,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Shenzhen Key Laboratory of Robotics Perception and Intelligence","award":["ZDSYS20200810171800001"],"award-info":[{"award-number":["ZDSYS20200810171800001"]}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62473191"],"award-info":[{"award-number":["62473191"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Shenzhen Science and Technology Program","award":["RCBS20221008093305007"],"award-info":[{"award-number":["RCBS20221008093305007"]}]},{"name":"Young Elite Scientists Sponsorship Program by CAST","award":["2023QNRC001"],"award-info":[{"award-number":["2023QNRC001"]}]},{"DOI":"10.13039\/501100001809","name":"High Level of Special Funds from Southern University of Science and Technology, Shenzhen, China","doi-asserted-by":"publisher","award":["G03034K003"],"award-info":[{"award-number":["G03034K003"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3551458","type":"journal-article","created":{"date-parts":[[2025,3,27]],"date-time":"2025-03-27T02:27:47Z","timestamp":1743042467000},"page":"1-10","source":"Crossref","is-referenced-by-count":1,"title":["A Multitask Learning Framework for Automated Cobb Angle Estimation"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-4064-4754","authenticated-orcid":false,"given":"Jie","family":"Yang","sequence":"first","affiliation":[{"name":"Department of Electronic and Electrical Engineering, Shenzhen Key Laboratory of Robotics Perception and Intelligence, Southern University of Science and Technology, Shenzhen, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9139-0291","authenticated-orcid":false,"given":"Jiankun","family":"Wang","sequence":"additional","affiliation":[{"name":"Department of Electronic and Electrical Engineering, Shenzhen Key Laboratory of Robotics Perception and Intelligence, Southern University of Science and Technology, Shenzhen, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5255-5898","authenticated-orcid":false,"given":"Max Q.-H.","family":"Meng","sequence":"additional","affiliation":[{"name":"Department of Electronic and Electrical Engineering, Shenzhen Key Laboratory of Robotics Perception and Intelligence, Southern University of Science and Technology, Shenzhen, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/S0140-6736(08)60658-3"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.5582\/irdr.2014.01032"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3296838"},{"issue":"26","key":"ref4","first-page":"1","article-title":"Outline for the study of scoliosis","volume":"5","author":"Cobb","year":"1948","journal-title":"Amer. Acad. Orthopaedic Surgeons, Instructional Course Lect."},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3085110"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/s00586-007-0401-3"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-59050-9_42"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.media.2018.05.005"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.media.2019.101542"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3184341"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-39752-4_7"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ICASSP.2013.6639349"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.3115\/v1\/D14-1179"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1097\/brs.0b013e3182a0c7c3"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/s10916-011-9654-9"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1007\/s13534-014-0129-z"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/0031-3203(81)90009-1"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.media.2021.102277"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-87240-3_47"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.2992081"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/JBHI.2022.3229847"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/JBHI.2023.3258361"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2017.660"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.90"},{"key":"ref25","first-page":"6105","article-title":"EfficientNet: Rethinking model scaling for convolutional neural networks","volume-title":"Proc. Int. Conf. Mach. Learn.","author":"Tan"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-66182-7_15"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-69541-5_38"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ICPR48806.2021.9412027"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/JBHI.2021.3057647"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/JBHI.2022.3158968"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-87240-3_36"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-39752-4_6"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-39752-4_9"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-39752-4_10"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-39752-4_11"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-39752-4_12"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/10938852.pdf?arnumber=10938852","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,4,3]],"date-time":"2025-04-03T00:08:34Z","timestamp":1743638914000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10938852\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":36,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3551458","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}