{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,4,25]],"date-time":"2025-04-25T04:14:36Z","timestamp":1745554476524,"version":"3.40.4"},"reference-count":36,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/USG.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3551579","type":"journal-article","created":{"date-parts":[[2025,3,14]],"date-time":"2025-03-14T17:47:01Z","timestamp":1741974421000},"page":"1-7","source":"Crossref","is-referenced-by-count":0,"title":["Dual-Frequency-Bias Programmable Josephson Voltage Standard Circuit"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-1230-4744","authenticated-orcid":false,"given":"Alain","family":"R\u00fcfenacht","sequence":"first","affiliation":[{"name":"National Institute of Standards and Technology, Boulder, CO, USA"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5452-1125","authenticated-orcid":false,"given":"Anna E.","family":"Fox","sequence":"additional","affiliation":[{"name":"National Institute of Standards and Technology, Boulder, CO, USA"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7016-3946","authenticated-orcid":false,"given":"Raegan L.","family":"Johnson-Wilke","sequence":"additional","affiliation":[{"name":"National Institute of Standards and Technology, Boulder, CO, USA"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1817-9390","authenticated-orcid":false,"given":"Benjamin T.","family":"Scheck","sequence":"additional","affiliation":[{"name":"National Institute of Standards and Technology, Boulder, CO, USA"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2493-0504","authenticated-orcid":false,"given":"Paul D.","family":"Dresselhaus","sequence":"additional","affiliation":[{"name":"National Institute of Standards and Technology, Boulder, CO, USA"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8679-0765","authenticated-orcid":false,"given":"Samuel P.","family":"Benz","sequence":"additional","affiliation":[{"name":"National Institute of Standards and Technology, Boulder, CO, USA"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/19.377816"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1088\/1681-7575\/aad41a"},{"volume-title":"Mise en Pratique for the Definition of the Ampere and Other Electric Units in the SI","key":"ref3"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/cpem49742.2020.9191831"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2018.8500911"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TASC.2010.2079310"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2010.2101191"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1080\/19315775.2017.1316696"},{"volume-title":"Fractional\/Integer-N PLL Basics","year":"1999","author":"Barrett","key":"ref9"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2884047"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1088\/0026-1394\/50\/5\/441"},{"key":"ref12","first-page":"1","article-title":"Fast and almost continuously programmable Josephson voltage standard system with multiple-frequency microwave drive","author":"Chong","year":"2006","journal-title":"CPEM Dig."},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2225928"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/23\/12\/124003"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2016.7540473"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM49742.2020.9191899"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM61406.2024.10646146"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1063\/1.2901683"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1088\/1681-7575\/aacbeb"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2016.2619998"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM61406.2024.10646095"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TASC.2009.2019245"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2009.2025464"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TASC.2006.881816"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/19.278560"},{"volume-title":"Josephson voltage standard","year":"2023","author":"Rufenacht","key":"ref26"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/19.571821"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1088\/0026-1394\/49\/6\/635"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2015.2418455"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2013.2238014"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TASC.2014.2377744"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2014.2374697"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2010.5543391"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2896011"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/ac055e"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1088\/1681-7575\/ad57ca"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/10926856.pdf?arnumber=10926856","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,4,24]],"date-time":"2025-04-24T05:00:00Z","timestamp":1745470800000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10926856\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":36,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3551579","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2025]]}}}