{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,4,19]],"date-time":"2025-04-19T04:05:02Z","timestamp":1745035502730,"version":"3.40.4"},"reference-count":28,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51975250","51675229"],"award-info":[{"award-number":["51975250","51675229"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100007847","name":"Jilin Natural Science Foundation","doi-asserted-by":"crossref","award":["2020122366JC","20220402020GH"],"award-info":[{"award-number":["2020122366JC","20220402020GH"]}],"id":[{"id":"10.13039\/100007847","id-type":"DOI","asserted-by":"crossref"}]},{"DOI":"10.13039\/501100015973","name":"Scientific Research Foundation for Leading Professor Program of Jilin University","doi-asserted-by":"publisher","award":["419080500171","419080500246"],"award-info":[{"award-number":["419080500171","419080500246"]}],"id":[{"id":"10.13039\/501100015973","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3551818","type":"journal-article","created":{"date-parts":[[2025,3,18]],"date-time":"2025-03-18T17:33:02Z","timestamp":1742319182000},"page":"1-10","source":"Crossref","is-referenced-by-count":0,"title":["Highly Sensitive Mass Sensing Scheme via Energy Re-Localization With Un-Equally Coupled Cantilever Array"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-3681-4167","authenticated-orcid":false,"given":"Jing","family":"Hong","sequence":"first","affiliation":[{"name":"School of Mechanical and Vehicle Engineering, Changchun University, Changchun, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0002-3391-6819","authenticated-orcid":false,"given":"Wang","family":"Cai","sequence":"additional","affiliation":[{"name":"Micro Engineering and Micro Systems Laboratory (JML), School of Mechanical and Aerospace Engineering, Jilin University, Changchun, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0921-2857","authenticated-orcid":false,"given":"Dong F.","family":"Wang","sequence":"additional","affiliation":[{"name":"Micro Engineering and Micro Systems Laboratory (JML), School of Mechanical and Aerospace Engineering, Key Laboratory of CNC Equipment Reliability, Ministry of Education, Jilin University, Changchun, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1028-9093","authenticated-orcid":false,"given":"Xiaodong","family":"Li","sequence":"additional","affiliation":[{"name":"Micro Engineering and Micro Systems Laboratory (JML), School of Mechanical and Aerospace Engineering, Jilin University, Changchun, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6021-7269","authenticated-orcid":false,"given":"Di","family":"Zhou","sequence":"additional","affiliation":[{"name":"Micro Engineering and Micro Systems Laboratory (JML), School of Mechanical and Aerospace Engineering, Jilin University, Changchun, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0524-0578","authenticated-orcid":false,"given":"Jian","family":"Yang","sequence":"additional","affiliation":[{"name":"Micro Engineering and Micro Systems Laboratory (JML), School of Mechanical and Aerospace Engineering, Jilin University, Changchun, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1038\/nnano.2006.208"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3052011"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1088\/1361-665X\/ab78b6"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JMEMS.2019.2908879"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.125.254301"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2014.2301835"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2020.107002"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2024.111203"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2018.2878695"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1063\/1.3569588"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JMEMS.2016.2598780"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2024.3405931"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2018.2889646"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.mee.2009.01.022"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1088\/0960-1317\/25\/9\/095017"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2016.07.015"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1115\/1.4000314"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2011.12.032"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.11591\/ijece.v5i3.pp403-408"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1063\/1.1948521"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1063\/1.5003023"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2022.3204189"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1063\/1.2732200"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1007\/s00542-012-1520-2"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2019.2955151"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1063\/1.2216889"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/JMEMS.2009.2025999"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1063\/5.0007446"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/10929643.pdf?arnumber=10929643","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,4,18]],"date-time":"2025-04-18T04:47:51Z","timestamp":1744951671000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10929643\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":28,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3551818","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2025]]}}}