{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,4,5]],"date-time":"2025-04-05T08:40:01Z","timestamp":1743842401683,"version":"3.40.3"},"reference-count":19,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52362052","52467006"],"award-info":[{"award-number":["52362052","52467006"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004479","name":"Natural Science Foundation of Jiangxi Province","doi-asserted-by":"publisher","award":["20232BAB204065","20232BAB214061"],"award-info":[{"award-number":["20232BAB204065","20232BAB214061"]}],"id":[{"id":"10.13039\/501100004479","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3551978","type":"journal-article","created":{"date-parts":[[2025,3,31]],"date-time":"2025-03-31T23:29:32Z","timestamp":1743463772000},"page":"1-10","source":"Crossref","is-referenced-by-count":0,"title":["Improved Median Mode Decomposition-Based Fault Detection Method in VSC Interfaced DC System"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-0128-938X","authenticated-orcid":false,"given":"Dongyu","family":"Li","sequence":"first","affiliation":[{"name":"School of Electrical and Automation Engineering, East China Jiaotong University, Nanchang, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0009-1509-5915","authenticated-orcid":false,"given":"Ziyan","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Electrical and Automation Engineering, East China Jiaotong University, Nanchang, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0189-2333","authenticated-orcid":false,"given":"Bo","family":"Gao","sequence":"additional","affiliation":[{"name":"School of Electrical and Automation Engineering, East China Jiaotong University, Nanchang, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0009-6669-8388","authenticated-orcid":false,"given":"Jian","family":"Han","sequence":"additional","affiliation":[{"name":"School of Electrical and Automation Engineering, East China Jiaotong University, Nanchang, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1156-0930","authenticated-orcid":false,"given":"Fangming","family":"Deng","sequence":"additional","affiliation":[{"name":"School of Electrical and Automation Engineering, East China Jiaotong University, Nanchang, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5734-4002","authenticated-orcid":false,"given":"Zewen","family":"Li","sequence":"additional","affiliation":[{"name":"School of Electrical and Automation Engineering, East China Jiaotong University, Nanchang, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/PowerAfrica52236.2021.9543284"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2016.2608986"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2016.2590501"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/EI250167.2020.9347259"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2018.2882431"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IEEECONF62358.2024.10453213"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2022.3194420"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2006.877086"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2021.3092520"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/APPEEC.2012.6307375"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/APPEEC.2016.7779829"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/IECON.2016.7793094"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/SCOPES.2016.7955579"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.2988193"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/PandaFPE57779.2023.10140514"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.3038056"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1098\/rspa.1998.0193"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/AUPEC48547.2019.211920"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2018.2796068"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/10946231.pdf?arnumber=10946231","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,4,5]],"date-time":"2025-04-05T08:26:54Z","timestamp":1743841614000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10946231\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3551978","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2025]]}}}