{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,9]],"date-time":"2026-04-09T04:16:39Z","timestamp":1775708199996,"version":"3.50.1"},"reference-count":31,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100012166","name":"National Key Research and Development Program of China","doi-asserted-by":"publisher","award":["2020YFB1200300ZL"],"award-info":[{"award-number":["2020YFB1200300ZL"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100018525","name":"Key Research and Development Project of Sichuan Province","doi-asserted-by":"publisher","award":["2023ZDZX0011"],"award-info":[{"award-number":["2023ZDZX0011"]}],"id":[{"id":"10.13039\/501100018525","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3552873","type":"journal-article","created":{"date-parts":[[2025,3,21]],"date-time":"2025-03-21T19:14:05Z","timestamp":1742584445000},"page":"1-11","source":"Crossref","is-referenced-by-count":1,"title":["A Sparse Weighting Hoyer Indicator Fault Diagnostic Algorithm for Bearing"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-2250-4272","authenticated-orcid":false,"given":"Gang","family":"Yang","sequence":"first","affiliation":[{"name":"School of Mechanical Engineering, Southwest Jiaotong University, Chengdu, Sichuan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0008-2716-0051","authenticated-orcid":false,"given":"Lei","family":"Cheng","sequence":"additional","affiliation":[{"name":"Tangshan Institute, Southwest Jiaotong University, Chengdu, Sichuan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0001-2038-5839","authenticated-orcid":false,"given":"Wuyi","family":"Xu","sequence":"additional","affiliation":[{"name":"CRRC Zhuzhou Institute Company Ltd., Zhuzhou, Hunan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.aej.2020.10.044"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2021.108374"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2023.110846"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2018.07.038"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.3390\/machines10040242"},{"issue":"5","key":"ref6","first-page":"1447","article-title":"Improved EEMD and MSB demodulation methods and their applications in bearing fault feature extraction","volume":"36","author":"Dong","year":"2023","journal-title":"J. Vibrat. Eng."},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/s12206-021-0417-3"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/ad11cc"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2024.3423353"},{"issue":"2","key":"ref10","first-page":"217","article-title":"Fault diagnosis of rolling bearings in strong background noise environment based on SSA-VMD-MCKD","volume":"42","author":"Liang","year":"2023","journal-title":"Vibrat. Shock"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2019.03.033"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.jsv.2018.06.055"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2022.112162"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2023.3277516"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2021.108018"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2004.09.002"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2004.09.001"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2005.12.002"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/aa8a57"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2020.106755"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/ad0d74"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1007\/s40430-022-03549-0"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2020.107733"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.isatra.2021.08.025"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1177\/14759217241235337"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2019.05.003"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3067186"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2010.12.011"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2017.12.009"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2024.111175"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1115\/1.3453905"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/10934018.pdf?arnumber=10934018","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,4,5]],"date-time":"2025-04-05T09:58:55Z","timestamp":1743847135000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10934018\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":31,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3552873","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}