{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,15]],"date-time":"2026-06-15T14:45:32Z","timestamp":1781534732329,"version":"3.54.5"},"reference-count":33,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100020793","name":"Major Project of the New Generation of Artificial Intelligence","doi-asserted-by":"publisher","award":["2018AAA0102900"],"award-info":[{"award-number":["2018AAA0102900"]}],"id":[{"id":"10.13039\/501100020793","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"crossref","award":["52130505"],"award-info":[{"award-number":["52130505"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"crossref"}]},{"name":"Zhejiang Provincial Natural Science Foundation of China","award":["LD24E050005"],"award-info":[{"award-number":["LD24E050005"]}]},{"name":"Ningbo Key Scientific and Technological Project","award":["2022Z040"],"award-info":[{"award-number":["2022Z040"]}]},{"DOI":"10.13039\/501100012166","name":"National Key Research and Development Program of China","doi-asserted-by":"publisher","award":["2022YFE0113700"],"award-info":[{"award-number":["2022YFE0113700"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100012226","name":"Fundamental Research Funds for the Central Universities","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100012226","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3553963","type":"journal-article","created":{"date-parts":[[2025,4,7]],"date-time":"2025-04-07T21:32:51Z","timestamp":1744061571000},"page":"1-11","source":"Crossref","is-referenced-by-count":7,"title":["Tactile Skewness Analysis and Contact State Recognition by Fusing Tactile and Wrist Force for Flexible Printed Circuits Assembly Task"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-6376-1830","authenticated-orcid":false,"given":"Nannan","family":"Du","sequence":"first","affiliation":[{"name":"School of Automation Science and Electrical Engineering, Beihang University, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9099-240X","authenticated-orcid":false,"given":"Liang","family":"Yan","sequence":"additional","affiliation":[{"name":"School of Automation Science and Electrical Engineering, Beihang University, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5463-0145","authenticated-orcid":false,"given":"Pengjie","family":"Xiang","sequence":"additional","affiliation":[{"name":"School of Automation Science and Electrical Engineering, Beihang University, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8413-5858","authenticated-orcid":false,"given":"Xinghua","family":"He","sequence":"additional","affiliation":[{"name":"School of Automation Science and Electrical Engineering, Beihang University, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8866-2612","authenticated-orcid":false,"given":"Suwan","family":"Bu","sequence":"additional","affiliation":[{"name":"School of Automation Science and Electrical Engineering, Beihang University, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4831-3781","authenticated-orcid":false,"given":"I-Ming","family":"Chen","sequence":"additional","affiliation":[{"name":"School of Mechanical and Aerospace Engineering, Nanyang Technological University, Nanyang Avenue, Singapore"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.3390\/machines10050367"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.23919\/CCC52363.2021.9549634"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijhm.2023.103682"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2024.3381666"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3328699"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/RCAR52367.2021.9517545"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/978-981-99-6483-3_47"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2024.3395770"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/LRA.2022.3209161"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3135552"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/LRA.2022.3155821"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1177\/1729881419851619"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1108\/AA-11-2020-0170"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1177\/00202940221144479"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3246509"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1007\/s11227-023-05254-8"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.displa.2023.102631"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2023.3323307"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2024.3383886"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2023.3264650"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2023.3320710"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1155\/2014\/497275"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/IROS47612.2022.9981639"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2018.2869477"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1145\/3584376.3584576"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1007\/978-981-99-2789-0_23"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TRO.2009.2033627"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.2984443"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3031156"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/LRA.2022.3176718"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.2991\/icmmita-15.2015.260"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-011-3501-5"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.23919\/ACC50511.2021.9482981"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/10955292.pdf?arnumber=10955292","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,4,14]],"date-time":"2025-04-14T17:37:43Z","timestamp":1744652263000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10955292\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":33,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3553963","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}