{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,5]],"date-time":"2025-11-05T18:46:58Z","timestamp":1762368418491,"version":"build-2065373602"},"reference-count":43,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62175258","62303470","61973308"],"award-info":[{"award-number":["62175258","62303470","61973308"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"China University of Mining and Technology (Beijing) College Student Innovation Training Program","doi-asserted-by":"publisher","award":["202413029"],"award-info":[{"award-number":["202413029"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3554279","type":"journal-article","created":{"date-parts":[[2025,3,26]],"date-time":"2025-03-26T03:19:46Z","timestamp":1742959186000},"page":"1-8","source":"Crossref","is-referenced-by-count":0,"title":["High-Sensitivity and Wide-Range Biomimetic Crack Flexible Pressure Sensor"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0009-0002-8794-513X","authenticated-orcid":false,"given":"Yan","family":"Li","sequence":"first","affiliation":[{"name":"Department of Intelligent Control and Robotics, School of Mechanical and Electrical Engineering, China University of Mining and Technology-Beijing, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0001-4419-7250","authenticated-orcid":false,"given":"Zongzheng","family":"Zhang","sequence":"additional","affiliation":[{"name":"Department of Intelligent Control and Robotics, School of Mechanical and Electrical Engineering, China University of Mining and Technology-Beijing, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5166-1317","authenticated-orcid":false,"given":"Fuling","family":"Yang","sequence":"additional","affiliation":[{"name":"Department of Intelligent Control and Robotics, School of Mechanical and Electrical Engineering, China University of Mining and Technology-Beijing, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0009-3309-5716","authenticated-orcid":false,"given":"Huaxu","family":"Zhou","sequence":"additional","affiliation":[{"name":"Department of Intelligent Control and Robotics, School of Mechanical and Electrical Engineering, China University of Mining and Technology-Beijing, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0000-4459-7388","authenticated-orcid":false,"given":"Sicheng","family":"Zong","sequence":"additional","affiliation":[{"name":"Department of Intelligent Control and Robotics, School of Mechanical and Electrical Engineering, China University of Mining and Technology-Beijing, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0000-2760-7986","authenticated-orcid":false,"given":"Bowen","family":"Zhang","sequence":"additional","affiliation":[{"name":"Department of Intelligent Control and Robotics, School of Mechanical and Electrical Engineering, China University of Mining and Technology-Beijing, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0007-1670-0748","authenticated-orcid":false,"given":"Le","family":"Cao","sequence":"additional","affiliation":[{"name":"School of Electronic and Electrical Engineering, Shanghai University of Engineering Science, Shanghai, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2020.3038003"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2024.3378283"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1002\/adma.202402542"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2019.2914621"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2022.3186049"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.cej.2024.154868"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3343795"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.cej.2024.153525"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1002\/smll.202204806"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1021\/acsami.8b17666"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.apmt.2024.102064"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.compscitech.2022.109881"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.compositesa.2021.106665"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.3390\/app11094168"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1021\/acsanm.1c00217"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1039\/D0TC02913K"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.3390\/s19020318"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1021\/acsami.3c08050"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1021\/acsnano.0c03659"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1002\/smll.201600760"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/JEDS.2017.2683558"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1038\/srep40116"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.nanoen.2022.106970"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.nanoen.2020.104847"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2023.3266753"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.cej.2023.148102"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1038\/nature14002"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1021\/acsami.1c16646"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1002\/adem.202070011"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1038\/s41528-023-00255-2"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1039\/D2NA00127F"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1039\/C6MH00027D"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1021\/acsanm.3c03718"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1007\/s11044-020-09767-5"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1038\/s41378-022-00477-w"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1016\/j.cej.2023.142151"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1016\/j.compscitech.2022.109308"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1038\/s41528-023-00247-2"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1002\/adfm.202314479"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1021\/acssensors.1c00484"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1021\/acsami.3c14281"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1002\/admt.202101511"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.3390\/nano11030716"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/10938719.pdf?arnumber=10938719","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,11,5]],"date-time":"2025-11-05T18:39:24Z","timestamp":1762367964000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10938719\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":43,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3554279","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2025]]}}}