{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,30]],"date-time":"2026-05-30T00:04:46Z","timestamp":1780099486150,"version":"3.54.0"},"reference-count":38,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100017596","name":"Natural Science Basic Research Program of Shaanxi","doi-asserted-by":"publisher","award":["2024JC-YBMS-490"],"award-info":[{"award-number":["2024JC-YBMS-490"]}],"id":[{"id":"10.13039\/501100017596","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3555674","type":"journal-article","created":{"date-parts":[[2025,3,29]],"date-time":"2025-03-29T03:20:35Z","timestamp":1743218435000},"page":"1-14","source":"Crossref","is-referenced-by-count":4,"title":["RP-CFANet: An Adaptive Photovoltaic Hot-Spot Fault Detection Network Based on Region Perception and Cross-Channel Feature Aggregation"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-6133-0324","authenticated-orcid":false,"given":"Shuai","family":"Hao","sequence":"first","affiliation":[{"name":"College of Electrical and Control Engineering, Xi’an University of Science and Technology, Xi’an, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0003-4578-6553","authenticated-orcid":false,"given":"Tianrui","family":"Qi","sequence":"additional","affiliation":[{"name":"College of Electrical and Control Engineering, Xi’an University of Science and Technology, Xi’an, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6765-2025","authenticated-orcid":false,"given":"Xu","family":"Ma","sequence":"additional","affiliation":[{"name":"College of Electrical and Control Engineering, Xi’an University of Science and Technology, Xi’an, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0008-6829-1859","authenticated-orcid":false,"given":"Jiahao","family":"Li","sequence":"additional","affiliation":[{"name":"College of Electrical and Control Engineering, Xi’an University of Science and Technology, Xi’an, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0003-5210-2906","authenticated-orcid":false,"given":"Tianqi","family":"Li","sequence":"additional","affiliation":[{"name":"College of Electrical and Control Engineering, Xi’an University of Science and Technology, Xi’an, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2199196"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2024.3506564"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.enconman.2022.115666"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.enconman.2022.116376"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1002\/cta.3629"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2016.7736846"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.3047066"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3130889"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1049\/iet-rpg.2016.1041"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.solener.2020.08.027"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2900961"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JPHOTOV.2019.2955183"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2023.3274823"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-46448-0_2"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2019.00667"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3269099"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.engappai.2024.107866"},{"issue":"4","key":"ref18","first-page":"420","article-title":"Improved SSD of photovoltaic module hotspot defect detection method","volume":"29","author":"Wang","year":"2023","journal-title":"Trans. Tianjin Univ."},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3335509"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2022.3162846"},{"issue":"22","key":"ref21","first-page":"7","article-title":"Photovoltaic hot spot detection of aerial infrared image based on deep learning","volume":"45","author":"Guan","year":"2022","journal-title":"Electric Meas. Technol."},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1007\/s11554-024-01415-x"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.apenergy.2024.123759"},{"issue":"S2","key":"ref24","first-page":"191","article-title":"Thermal spot object detection method for infrared images of photovoltaic modules based on improved YOLOv7","volume":"43","author":"SYin","year":"2023","journal-title":"J. Comput. Appl."},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ICAIBD57115.2023.10206126"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-24574-4_28"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-01264-9_8"},{"issue":"3","key":"ref28","first-page":"514","article-title":"Detection of small targets in UAV aerial imagery based on inverted residual attention","volume":"49","author":"Liu","year":"2022","journal-title":"J. Beijing Univ. Aeronaut. Astronaut."},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00745"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2017.89"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/ICASSP49357.2023.10096516"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00474"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.48550\/arXiv.1802.02611"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2017.660"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2015.7298965"},{"key":"ref36","article-title":"EfficientNet: Rethinking model scaling for convolutional neural networks","author":"Tan","year":"2019","journal-title":"arXiv:1905.11946"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2017.324"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR46437.2021.00841"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/10945491.pdf?arnumber=10945491","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,4,25]],"date-time":"2025-04-25T05:05:36Z","timestamp":1745557536000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10945491\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":38,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3555674","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}