{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,25]],"date-time":"2026-02-25T17:26:21Z","timestamp":1772040381605,"version":"3.50.1"},"reference-count":39,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100012166","name":"National Key Research and Development Program of China","doi-asserted-by":"publisher","award":["2022YFF0607600"],"award-info":[{"award-number":["2022YFF0607600"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]},{"name":"National Key Research and Development Program of China","award":["2022YFF0605502"],"award-info":[{"award-number":["2022YFF0605502"]}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62475195"],"award-info":[{"award-number":["62475195"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Shanghai Youth Science and Technology Rising Star Program","award":["23QA1409400"],"award-info":[{"award-number":["23QA1409400"]}]},{"name":"Open Project of Shanghai Key Laboratory of Online Detection and Control Technology","award":["ZX2023103"],"award-info":[{"award-number":["ZX2023103"]}]},{"name":"Science and Technology on Metrology and Calibration Laboratory","award":["JLKG2023001B001"],"award-info":[{"award-number":["JLKG2023001B001"]}]},{"DOI":"10.13039\/501100004750","name":"Aeronautical Science Foundation of China","doi-asserted-by":"publisher","award":["ASFC-20230056038001"],"award-info":[{"award-number":["ASFC-20230056038001"]}],"id":[{"id":"10.13039\/501100004750","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3555720","type":"journal-article","created":{"date-parts":[[2025,3,31]],"date-time":"2025-03-31T19:29:32Z","timestamp":1743449372000},"page":"1-10","source":"Crossref","is-referenced-by-count":3,"title":["A Novel On-Site Primary Accelerometer Calibration Method Based on Homodyne Self-Traceable Grating Interferometer"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0009-0008-0834-7662","authenticated-orcid":false,"given":"Zhikun","family":"Chang","sequence":"first","affiliation":[{"name":"School of Physics Science and Engineering, Tongji University, Shanghai, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4919-8201","authenticated-orcid":false,"given":"Xiao","family":"Deng","sequence":"additional","affiliation":[{"name":"School of Physics Science and Engineering, Tongji University, Shanghai, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0002-5220-1894","authenticated-orcid":false,"given":"Haoran","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Physics Science and Engineering, Tongji University, Shanghai, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0006-6014-3419","authenticated-orcid":false,"given":"Xiaoling","family":"Han","sequence":"additional","affiliation":[{"name":"School of Physics Science and Engineering, Tongji University, Shanghai, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0000-1583-0734","authenticated-orcid":false,"given":"Xiaoyu","family":"Shen","sequence":"additional","affiliation":[{"name":"School of Physics Science and Engineering, Tongji University, Shanghai, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2482-2311","authenticated-orcid":false,"given":"Pengfei","family":"Niu","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Tianjin, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2186-7773","authenticated-orcid":false,"given":"Jing","family":"Yu","sequence":"additional","affiliation":[{"name":"College of Metrology and Testing Engineering, China Jiliang University, Hangzhou, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0004-9437-5010","authenticated-orcid":false,"given":"Song","family":"Song","sequence":"additional","affiliation":[{"name":"School of Computer Science and Technology, Zhejiang University of Water Resources and Electric Power, Hangzhou, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3855-483X","authenticated-orcid":false,"given":"Xinbin","family":"Cheng","sequence":"additional","affiliation":[{"name":"School of Physics Science and Engineering, Tongji University, Shanghai, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0004-2976-8926","authenticated-orcid":false,"given":"Zhoumiao","family":"Shi","sequence":"additional","affiliation":[{"name":"Shenzhen Institute of Technology Innovation, NIM, Shenzhen, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0006-2196-2120","authenticated-orcid":false,"given":"Lifeng","family":"Duan","sequence":"additional","affiliation":[{"name":"Shanghai Yuwei Semiconductor Technology Company Ltd., Shanghai, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0005-5772-8689","authenticated-orcid":false,"given":"Gang","family":"Sun","sequence":"additional","affiliation":[{"name":"Shanghai Yuwei Semiconductor Technology Company Ltd., Shanghai, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0003-0480-9181","authenticated-orcid":false,"given":"Tongbao","family":"Li","sequence":"additional","affiliation":[{"name":"School of Physics Science and Engineering, Tongji University, Shanghai, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.eng.2020.07.017"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-021-01769-0"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/s12647-021-00453-1"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2021.3083596"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3139698"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1002\/aisy.202100228"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3066542"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.29026\/oea.2021.200045"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6439\/acec7e"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2021.3097585"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JMEMS.2020.3036121"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.55198\/artibilimfen.1386846"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/s12541-014-0372-3"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.3390\/s20247207"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.3017897"},{"key":"ref16","volume-title":"Methods for the Calibration of Vibration and Shock Transducers-part11: Primary Vibration Calibration By Laser Interferometry","year":"1999"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2022.112044"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1088\/1681-7575\/ac0403"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1364\/OE.23.026377"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1126\/science.262.5135.877"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/ad70d1"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.69.1636"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/S0040-6090(00)00679-9"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1364\/OL.20.002535"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1007\/s00340-003-1281-9"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1063\/1.1818347"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1088\/0953-8984\/15\/6\/201"},{"issue":"9","key":"ref28","first-page":"497","article-title":"Imaging an atomic beam using fluorescence","volume":"1","author":"He","year":"2003","journal-title":"Chin. Opt. Lett."},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1007\/s41871-022-00140-y"},{"key":"ref30","doi-asserted-by":"crossref","first-page":"285","DOI":"10.1016\/j.precisioneng.2023.12.008","article-title":"Optimization and fabrication of chromium grating in self-traceable interferometer","volume":"86","author":"Lin","year":"2024","journal-title":"Precis. Eng."},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.6028\/jres.108.0010"},{"key":"ref32","article-title":"Length traceability chain based on chromium atom transition frequency","author":"Deng","year":"2023","journal-title":"arXiv:2302.14633"},{"key":"ref33","doi-asserted-by":"crossref","first-page":"464","DOI":"10.1016\/j.apsusc.2012.08.033","article-title":"Investigation of shadow effect in laser-focused atomic deposition","volume":"261","author":"Deng","year":"2012","journal-title":"Appl. Surf. Sci."},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1143\/JJAP.47.1833"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/JPHOT.2018.2792447"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1631\/FITEE.1800708"},{"issue":"22","key":"ref37","doi-asserted-by":"crossref","first-page":"4550","DOI":"10.1364\/AO.50.004550","article-title":"Linear diffraction grating interferometer with high alignment tolerance and high accuracy","volume":"50","author":"Fang","year":"2011","journal-title":"Appl. Opt."},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/9\/2\/010"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/PROC.1967.5962"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/10945481.pdf?arnumber=10945481","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,11,5]],"date-time":"2025-11-05T18:39:39Z","timestamp":1762367979000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10945481\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":39,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3555720","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}