{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,4,18]],"date-time":"2025-04-18T05:10:00Z","timestamp":1744953000887,"version":"3.40.4"},"reference-count":18,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100006775","name":"Ansys and GE Healthcare","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100006775","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3556197","type":"journal-article","created":{"date-parts":[[2025,3,31]],"date-time":"2025-03-31T23:29:32Z","timestamp":1743463772000},"page":"1-8","source":"Crossref","is-referenced-by-count":0,"title":["Metrics for Acceptable Oscilloscope Bandwidth"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-2278-4307","authenticated-orcid":false,"given":"Aditya","family":"Rao","sequence":"first","affiliation":[{"name":"Department of Electrical and Computer Engineering, University of Colorado Boulder, Boulder, CO, USA"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5778-7989","authenticated-orcid":false,"given":"Eric","family":"Bogatin","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, University of Colorado Boulder, Boulder, CO, USA"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3109-5159","authenticated-orcid":false,"given":"Melinda","family":"Piket-May","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, University of Colorado Boulder, Boulder, CO, USA"}]}],"member":"263","reference":[{"volume-title":"12 Things to Consider When Choosing Your Next Scope","year":"2021","key":"ref1"},{"volume-title":"Evaluating Oscilloscope Bandwidths for Your Application","year":"2024","key":"ref2"},{"volume-title":"How To Avoid Gibbs Ringing Artifacts in Measurements","year":"2021","author":"Rao","key":"ref3"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/19.816121"},{"year":"2021","author":"Rao","article-title":"Numerical experiments with filter models applied to oscilloscope measurements","key":"ref5"},{"volume-title":"Back to Basics: Bandwidth and Rise Time","year":"2018","author":"Bogatin","key":"ref6"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1109\/mmm.2011.941412"},{"key":"ref8","first-page":"72","article-title":"Vacuum tube amplifiers","volume-title":"M. I. T. Radiation Laboratory Series","author":"Valley","year":"1948"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1002\/0471758159"},{"key":"ref10","first-page":"72","volume-title":"Signal and Power Integrity, Simplified","author":"Bogatin","year":"2018"},{"year":"2010","author":"Johnson","article-title":"Digital signal processing (DSP) in oscilloscopes","key":"ref11"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1109\/19.293446"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1109\/6.58452"},{"volume-title":"Waverunner 9000 Datasheet","year":"2019","key":"ref14"},{"volume-title":"Wavepro HD 12-bit High Definition Oscilloscopes Datasheet","year":"2018","key":"ref15"},{"key":"ref16","first-page":"198","article-title":"On a certain periodic function","volume":"3","author":"Wilbraham","year":"1848","journal-title":"The Cambridge and Dublin Mathematical Journal"},{"doi-asserted-by":"publisher","key":"ref17","DOI":"10.1038\/059200b0"},{"doi-asserted-by":"publisher","key":"ref18","DOI":"10.1007\/bf00330404"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/10945902.pdf?arnumber=10945902","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,4,18]],"date-time":"2025-04-18T04:48:59Z","timestamp":1744951739000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10945902\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3556197","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2025]]}}}