{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,1]],"date-time":"2026-05-01T16:07:52Z","timestamp":1777651672779,"version":"3.51.4"},"reference-count":26,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62225301"],"award-info":[{"award-number":["62225301"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62303032"],"award-info":[{"award-number":["62303032"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["42388101"],"award-info":[{"award-number":["42388101"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"2022 Industrial Technology Basic Public Service Platform Project","doi-asserted-by":"publisher","award":["2022-189-181"],"award-info":[{"award-number":["2022-189-181"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100002858","name":"China Postdoctoral Science Foundation","doi-asserted-by":"publisher","award":["2023M740192"],"award-info":[{"award-number":["2023M740192"]}],"id":[{"id":"10.13039\/501100002858","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3558813","type":"journal-article","created":{"date-parts":[[2025,4,14]],"date-time":"2025-04-14T17:37:43Z","timestamp":1744652263000},"page":"1-9","source":"Crossref","is-referenced-by-count":2,"title":["Design and Optimization Method of Hybrid Biplanar Coils for Suppressing Uniform and Gradient Residual Magnetic Field"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-2842-9699","authenticated-orcid":false,"given":"Shiqiang","family":"Zheng","sequence":"first","affiliation":[{"name":"Key Laboratory of Ultra-Weak Magnetic Field Measurement Technology, Ministry of Education, School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0007-8691-9972","authenticated-orcid":false,"given":"Ziyang","family":"Shi","sequence":"additional","affiliation":[{"name":"Key Laboratory of Ultra-Weak Magnetic Field Measurement Technology, Ministry of Education, School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6930-4000","authenticated-orcid":false,"given":"Haifeng","family":"Zhang","sequence":"additional","affiliation":[{"name":"Key Laboratory of Ultra-Weak Magnetic Field Measurement Technology, Ministry of Education, School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1619-9777","authenticated-orcid":false,"given":"Kangqi","family":"Tian","sequence":"additional","affiliation":[{"name":"Key Laboratory of Ultra-Weak Magnetic Field Measurement Technology, Ministry of Education, School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6909-6632","authenticated-orcid":false,"given":"Fengwen","family":"Zhao","sequence":"additional","affiliation":[{"name":"Zhejiang Provincial Key Laboratory of Ultra-Weak Magnetic-Field Space and Applied Technology, State Key Laboratory of Traditional Chinese Medicine Syndrome\/National Institute of Extremely-Weak Magnetic Field Infrastructure, Hangzhou Innovation Institute, Hangzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1063\/1.5001730"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevD.55.6760"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.ppnp.2013.03.003"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1038\/nature26147"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.clinph.2023.08.010"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3244249"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.neuroimage.2022.119084"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1063\/5.0101391"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.neuroimage.2023.120157"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2024.3404152"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/jerm.2024.3419232"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2025.3545997"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2017.2712776"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-021-01894-z"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-022-17346-1"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2024.3409895"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2024.3509871"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3108493"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.neuroimage.2018.07.028"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3159961"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-019-50697-w"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.3390\/en11030608"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2899544"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1063\/5.0027848"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/tevc.2024.3367747"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2023.126906"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/10964771.pdf?arnumber=10964771","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,5,5]],"date-time":"2025-05-05T17:55:11Z","timestamp":1746467711000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10964771\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":26,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3558813","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}