{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,11]],"date-time":"2026-04-11T13:20:49Z","timestamp":1775913649914,"version":"3.50.1"},"reference-count":28,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100012166","name":"Nationa Key Research and Development Program of China","doi-asserted-by":"publisher","award":["2024YFC2815202"],"award-info":[{"award-number":["2024YFC2815202"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]},{"name":"National Major Scientific Research Instrument Research and Development Project of China","award":["42127807"],"award-info":[{"award-number":["42127807"]}]},{"name":"Graduate Innovation Fund of Jilin University","award":["2025CX217"],"award-info":[{"award-number":["2025CX217"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3560747","type":"journal-article","created":{"date-parts":[[2025,4,28]],"date-time":"2025-04-28T17:33:10Z","timestamp":1745861590000},"page":"1-11","source":"Crossref","is-referenced-by-count":2,"title":["A New Broadband LCLCC Resonance Compensation Method for Emission Signal Enhancement of Depth-Focused Electromagnetic Detection Transmitter System"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-8280-0217","authenticated-orcid":false,"given":"Xinhao","family":"Zhang","sequence":"first","affiliation":[{"name":"College of Instrumentation and Electrical Engineering, Jilin University, Changchun, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0007-9772-0774","authenticated-orcid":false,"given":"He","family":"Wang","sequence":"additional","affiliation":[{"name":"State Grid Jilin Training Center, Changchun, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7366-4674","authenticated-orcid":false,"given":"Xiaoyu","family":"Pang","sequence":"additional","affiliation":[{"name":"State Grid Jilin Training Center, Changchun, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0009-3529-1788","authenticated-orcid":false,"given":"Chenglong","family":"Yang","sequence":"additional","affiliation":[{"name":"College of Instrumentation and Electrical Engineering, Jilin University, Changchun, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1386-9365","authenticated-orcid":false,"given":"Shengbao","family":"Yu","sequence":"additional","affiliation":[{"name":"College of Instrumentation and Electrical Engineering, Jilin University, Changchun, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1190\/geo2017-0777.1"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2021.3099493"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2016.2521219"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TAP.2017.2710225"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSTARS.2019.2910541"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3273652"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1190\/1.2133784"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2907495"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2022.3175502"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2021.3129286"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/8.814957"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2011.2156766"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.23919\/comex.2023XBL0165"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1063\/1.4908191"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2018.2810945"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3272058"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.2987280"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1063\/1.4943221"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3118097"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1063\/1.4999446"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2019.2927803"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2420041"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3023980"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2024.3358826"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1155\/2022\/2915275"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/LCOMM.2019.2897798"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2948610"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3308244"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/10979244.pdf?arnumber=10979244","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,5,2]],"date-time":"2025-05-02T11:25:55Z","timestamp":1746185155000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10979244\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":28,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3560747","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}