{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,2]],"date-time":"2026-04-02T16:07:38Z","timestamp":1775146058784,"version":"3.50.1"},"reference-count":27,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100012166","name":"National Key Research and Development Program of China","doi-asserted-by":"publisher","award":["2022YFB3205000"],"award-info":[{"award-number":["2022YFB3205000"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["U2230206"],"award-info":[{"award-number":["U2230206"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100015401","name":"Key Research and Development Program Projects of Shanxi Province","doi-asserted-by":"publisher","award":["202003D111004"],"award-info":[{"award-number":["202003D111004"]}],"id":[{"id":"10.13039\/501100015401","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3561371","type":"journal-article","created":{"date-parts":[[2025,4,23]],"date-time":"2025-04-23T17:55:20Z","timestamp":1745430920000},"page":"1-10","source":"Crossref","is-referenced-by-count":4,"title":["A Self-Test Method for MEMS Gyroscope With Equivalent Inertial Force"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0009-0005-2717-6326","authenticated-orcid":false,"given":"Rui","family":"Zhou","sequence":"first","affiliation":[{"name":"Science and Technology on Electronic Test and Measurement Laboratory, School of Instrument and Electronics, North University of China, Taiyuan, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0004-2100-5545","authenticated-orcid":false,"given":"Rang","family":"Cui","sequence":"additional","affiliation":[{"name":"Science and Technology on Electronic Test and Measurement Laboratory, School of Instrument and Electronics, North University of China, Taiyuan, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6046-6051","authenticated-orcid":false,"given":"Chong","family":"Shen","sequence":"additional","affiliation":[{"name":"Science and Technology on Electronic Test and Measurement Laboratory, School of Instrument and Electronics, North University of China, Taiyuan, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4394-6555","authenticated-orcid":false,"given":"Yunbo","family":"Shi","sequence":"additional","affiliation":[{"name":"Science and Technology on Electronic Test and Measurement Laboratory, School of Instrument and Electronics, North University of China, Taiyuan, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0009-9533-5439","authenticated-orcid":false,"given":"Jingfeng","family":"Yu","sequence":"additional","affiliation":[{"name":"Quanzhou Yunjian Measurement Control and Perception Technology Innovation Research Institute, Quanzhou, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0009-6489-4975","authenticated-orcid":false,"given":"Yanchao","family":"Ren","sequence":"additional","affiliation":[{"name":"Quanzhou Yunjian Measurement Control and Perception Technology Innovation Research Institute, Quanzhou, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9862-4329","authenticated-orcid":false,"given":"Huiliang","family":"Cao","sequence":"additional","affiliation":[{"name":"Science and Technology on Electronic Test and Measurement Laboratory, School of Instrument and Electronics, North University of China, Taiyuan, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2021.3117939"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2021.109704"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3186380"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3180424"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1049\/iet-epa.2018.5195"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/aafcaa"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2014.2303642"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2019.03.005"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3160538"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.3390\/s18093004"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2022.3210723"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.3390\/mi9070328"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2012.2185489"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.3390\/mi10030186"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2016.2626518"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.2977223"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2023.3281775"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1108\/SR-09-2019-0222"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1115\/1.4050351"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.3390\/mi12050506"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/JMEMS.2023.3279653"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/MEMS51670.2022.9699625"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.3044148"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/MEMSYS.2019.8870705"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1007\/s00542-016-3114-x"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2880697"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.3390\/mi15111385"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/10974702.pdf?arnumber=10974702","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,4,29]],"date-time":"2025-04-29T17:31:23Z","timestamp":1745947883000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10974702\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":27,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3561371","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}