{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,30]],"date-time":"2026-01-30T05:47:54Z","timestamp":1769752074221,"version":"3.49.0"},"reference-count":51,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52375540"],"award-info":[{"award-number":["52375540"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52225506"],"award-info":[{"award-number":["52225506"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Key Research and Development Project of Hubei Province","award":["2023BAB067"],"award-info":[{"award-number":["2023BAB067"]}]},{"DOI":"10.13039\/501100005229","name":"Major Science and Technology Foundation of Hubei Province","doi-asserted-by":"publisher","award":["2023BCA002"],"award-info":[{"award-number":["2023BCA002"]}],"id":[{"id":"10.13039\/501100005229","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3562984","type":"journal-article","created":{"date-parts":[[2025,4,21]],"date-time":"2025-04-21T17:37:36Z","timestamp":1745257056000},"page":"1-18","source":"Crossref","is-referenced-by-count":1,"title":["Ultrasonic Defect Characterization in Coarse-Grained Materials Using SHADE-A-TFM With Subarray-Based Parameter Optimization"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-1703-0762","authenticated-orcid":false,"given":"Changrong","family":"Guo","sequence":"first","affiliation":[{"name":"State Key Laboratory of Intelligent Manufacturing Equipment and Technology, School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3584-7637","authenticated-orcid":false,"given":"Heng","family":"Xiong","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Intelligent Manufacturing Equipment and Technology, School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0008-7509-5127","authenticated-orcid":false,"given":"Tao","family":"Ye","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Intelligent Manufacturing Equipment and Technology, School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9356-9447","authenticated-orcid":false,"given":"Jianfeng","family":"Xu","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Intelligent Manufacturing Equipment and Technology, School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0482-1514","authenticated-orcid":false,"given":"Long","family":"Bai","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Intelligent Manufacturing Equipment and Technology, School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1201\/9780203501962"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3001947"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2018.09.031"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2005.04.002"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.ultras.2023.107109"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2022.111690"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2012.07.006"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2020.102327"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/S0020-7683(99)00074-8"},{"key":"ref10","volume":"2","author":"Blitz","year":"1996","journal-title":"Ultrasonic Methods of Non-Destructive Testing"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/s10921-010-0080-6"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.ultras.2013.06.012"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/s10921-022-00900-2"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2023.102943"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1063\/1.3200962"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-020-79617-z"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1121\/1.4973954"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1063\/1.5099764"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1121\/1.415393"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2022.102660"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.ultras.2015.08.005"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ULTSYM.2019.8926059"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1121\/1.4931445"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.cmpb.2013.05.009"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2017.05.002"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.infrared.2017.11.023"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2015.09.008"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2022.102732"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.7551\/mitpress\/1090.001.0001"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/B978-0-08-051581-6.50059-3"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1023\/A:1008202821328"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/ICNN.1995.488968"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/j.asoc.2023.110386"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TEVC.2010.2059031"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TEVC.2009.2014613"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TEVC.2010.2087271"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1016\/j.asoc.2010.04.024"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1007\/s10489-007-0091-x"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/CEC.2013.6557555"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2024.111997"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/TUFFC.924"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/TUFFC.2018.2875781"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/TUFFC.2012.2278"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/TUFFC.2011.1901"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1007\/s10921-018-0498-9"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1115\/1.4056898"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1109\/MCI.2017.2742868"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1109\/TSMCB.2009.2015956"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1109\/TUFFC.2015.007334"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1016\/j.ultras.2023.107194"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1016\/j.jcp.2018.10.045"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/10972085.pdf?arnumber=10972085","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,5]],"date-time":"2025-06-05T04:23:20Z","timestamp":1749097400000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10972085\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":51,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3562984","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}