{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,7]],"date-time":"2025-05-07T04:18:55Z","timestamp":1746591535373,"version":"3.40.5"},"reference-count":16,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"U.K. Government's Department for Science, Innovation and Technology (DSIT) through the National Measurement System Program"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3563005","type":"journal-article","created":{"date-parts":[[2025,4,22]],"date-time":"2025-04-22T17:39:23Z","timestamp":1745343563000},"page":"1-9","source":"Crossref","is-referenced-by-count":0,"title":["Metrological Traceability for the Impedance of Coaxial Devices Using an LCR Meter"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-9753-4225","authenticated-orcid":false,"given":"James","family":"Skinner","sequence":"first","affiliation":[{"name":"Electromagnetic and Electrochemical Technologies Department, National Physical Laboratory, Teddington, U.K."}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7754-4856","authenticated-orcid":false,"given":"Murat","family":"Celep","sequence":"additional","affiliation":[{"name":"Electromagnetic and Electrochemical Technologies Department, National Physical Laboratory, Teddington, U.K."}]},{"ORCID":"https:\/\/orcid.org\/0009-0008-4614-8728","authenticated-orcid":false,"given":"Stephen","family":"Protheroe","sequence":"additional","affiliation":[{"name":"Electromagnetic and Electrochemical Technologies Department, National Physical Laboratory, Teddington, U.K."}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9653-1580","authenticated-orcid":false,"given":"Nick","family":"Fletcher","sequence":"additional","affiliation":[{"name":"Electromagnetic and Electrochemical Technologies Department, National Physical Laboratory, Teddington, U.K."}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1462-2914","authenticated-orcid":false,"given":"Nick","family":"Ridler","sequence":"additional","affiliation":[{"name":"Electromagnetic and Electrochemical Technologies Department, National Physical Laboratory, Teddington, U.K."}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MMM.2023.3321516"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/22.60011"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.1979.1129778"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2003.809101"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2219142"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2016.7540479"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1088\/0967-3334\/21\/3\/701"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM61406.2024.10646033"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ARFTG.1992.326972"},{"article-title":"Traceability for radio frequency coaxial line standards","year":"1992","author":"Ide","key":"ref10"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ieeestd.2022.9889249"},{"volume-title":"Calibration Kit Definitions","key":"ref12"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1088\/0026-1394\/49\/6\/644"},{"volume-title":"Specifying Calibration Standards Kits for Keysight Vector Netw. Analyzers","key":"ref14"},{"article-title":"VHF impedance measurement\u2014A review","year":"1993","author":"Ridler","key":"ref15"},{"key":"ref16","first-page":"2008","volume-title":"Evaluation of Measurement Data: Guide to the Expression of Uncertainty in Measurement","volume":"100","year":"2008"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/10974626.pdf?arnumber=10974626","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,5,6]],"date-time":"2025-05-06T17:02:30Z","timestamp":1746550950000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10974626\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3563005","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2025]]}}}