{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,24]],"date-time":"2026-07-24T00:25:21Z","timestamp":1784852721400,"version":"3.55.0"},"reference-count":57,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3563011","type":"journal-article","created":{"date-parts":[[2025,4,25]],"date-time":"2025-04-25T17:40:05Z","timestamp":1745602805000},"page":"1-11","source":"Crossref","is-referenced-by-count":20,"title":["SGT-YOLO: A Lightweight Method for PCB Defect Detection"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0009-0007-7921-5360","authenticated-orcid":false,"given":"Chiyao","family":"Mo","sequence":"first","affiliation":[{"name":"School of Electronics and Information Engineering, South China University of Technology, Guangzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3336-1817","authenticated-orcid":false,"given":"Zhihui","family":"Hu","sequence":"additional","affiliation":[{"name":"School of Electronics and Information Engineering, South China University of Technology, Guangzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0003-5324-2900","authenticated-orcid":false,"given":"Ji","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Electronics and Information Engineering, South China University of Technology, Guangzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0001-4125-8409","authenticated-orcid":false,"given":"Xiaolong","family":"Xiao","sequence":"additional","affiliation":[{"name":"School of Electronics and Information Engineering, South China University of Technology, Guangzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ICAICA52286.2021.9498174"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.jii.2021.100294"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/WiSPNET.2017.8299715"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1006\/cviu.1996.0020"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/5254.708428"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/s11749-016-0481-7"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/s10462-011-9272-4"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2024.3418082"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2024.3381700"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.ecoinf.2023.102445"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.scienta.2024.113355"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2024.3379090"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2024.3412210"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2014.81"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2015.169"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/tpami.2016.2577031"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/access.2020.3001349"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1049\/trit.2019.0019"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.48550\/arXiv.1512.02325"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR42600.2020.01079"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.91"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ICCASIT55263.2022.9986754"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.3390\/app112411701"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-023-36854-2"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1007\/s11554-024-01504-x"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-024-57491-3"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.3390\/electronics13173557"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/tii.2024.3507954"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2023.3326460"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2024.3488158"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2024.3386210"},{"key":"ref32","first-page":"10096","article-title":"EfficientNetV2: Smaller models and faster training","volume-title":"Int. Conf. Mach. Learn., Proc. Mach. Learn. Res.","author":"Tan"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-031-26409-2_27"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1016\/j.jksuci.2024.102223"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1016\/j.geoen.2024.213319"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1007\/s11554-024-01436-6"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.3233\/AIC-210245"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2021.116178"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1007\/s10586-023-04156-x"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2024.3351241"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2023.3322483"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-024-74368-7"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2024.3390198"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.3390\/app14177460"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijleo.2024.172036"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2019.2913372"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52733.2024.02617"},{"key":"ref48","first-page":"9969","article-title":"GhostNetV2: Enhance cheap operation with long-range attention","volume-title":"Proc. Adv. Neural Inf. Proces. Syst.","author":"Tang"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1117\/1.jrs.18.016514"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1504\/ijcis.2024.138785"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1049\/joe.2019.1183"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52733.2024.01605"},{"key":"ref53","doi-asserted-by":"crossref","DOI":"10.1007\/978-3-031-72751-1_1","article-title":"YOLOv9: Learning what you want tolearn using programmable gradient information","volume-title":"Proc. Eur. Conf. Comput. Vis.","author":"Wang"},{"key":"ref54","article-title":"YOLOv10: Real-time end-to-end object detection","author":"Wang","year":"2024","journal-title":"arXiv:2405.14458"},{"key":"ref55","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR42600.2020.01155"},{"key":"ref56","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR46437.2021.01350"},{"key":"ref57","doi-asserted-by":"publisher","DOI":"10.48550\/ARXIV.1807.06521"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/10977796.pdf?arnumber=10977796","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,24]],"date-time":"2025-06-24T06:28:27Z","timestamp":1750746507000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10977796\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":57,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3563011","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}