{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,20]],"date-time":"2026-05-20T15:42:15Z","timestamp":1779291735113,"version":"3.51.4"},"reference-count":40,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3563032","type":"journal-article","created":{"date-parts":[[2025,4,21]],"date-time":"2025-04-21T17:37:36Z","timestamp":1745257056000},"page":"1-13","source":"Crossref","is-referenced-by-count":3,"title":["Structure-Adaptive Graph Embedding With Fractal Analysis for Industrial Process Monitoring"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-5309-0140","authenticated-orcid":false,"given":"Jian","family":"Zheng","sequence":"first","affiliation":[{"name":"College of Information Science and Engineering, Northeastern University, Shenyang, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9736-6583","authenticated-orcid":false,"given":"Yingwei","family":"Zhang","sequence":"additional","affiliation":[{"name":"State Laboratory of Synthesis Automation of Process Industry, Northeastern University, Shenyang, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1614-9910","authenticated-orcid":false,"given":"Zhiming","family":"Fang","sequence":"additional","affiliation":[{"name":"College of Information Science and Engineering, Northeastern University, Shenyang, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8145-7883","authenticated-orcid":false,"given":"Zhuming","family":"Bi","sequence":"additional","affiliation":[{"name":"Department of Civil and Mechanical Engineering, Purdue University Fort Wayne, Fort Wayne, IN, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.isatra.2018.03.011"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.isatra.2021.10.024"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCSVT.2024.3491865"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2024.114287"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2024.3461768"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3280492"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2015.2493564"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.3019499"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2015.2396853"},{"key":"ref10","first-page":"153","article-title":"Locality preserving projections","volume-title":"Proc. NIPS","author":"He"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2005.167"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2015.11.004"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2022.110923"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.isatra.2019.08.022"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.cherd.2014.09.015"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1021\/acs.iecr.9b03077"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3183657"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2022.3233668"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2024.3522674"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2024.103262"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1007\/s12559-021-09875-0"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmatprotec.2010.10.013"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9780511841606"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1088\/0965-0393\/5\/4\/004"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1108\/03321641011028242"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1007\/s11595-012-0607-z"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-018-1448-1"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.patcog.2022.108844"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1021\/ie102564d"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2023.3243080"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1609\/aaai.v30i1.10168"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1145\/2623330.2623726"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/j.psep.2021.04.043"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1016\/j.ces.2020.116099"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1002\/cem.800"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3287247"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4471-0347-9"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3334335"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1016\/j.isatra.2018.10.011"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2023.3240601"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/10972025.pdf?arnumber=10972025","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,5,7]],"date-time":"2025-05-07T04:26:22Z","timestamp":1746591982000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10972025\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":40,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3563032","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}