{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,2]],"date-time":"2026-05-02T12:11:53Z","timestamp":1777723913801,"version":"3.51.4"},"reference-count":39,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100012166","name":"National Key Research and Development Program of China","doi-asserted-by":"publisher","award":["2023YFE0105800"],"award-info":[{"award-number":["2023YFE0105800"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62275093"],"award-info":[{"award-number":["62275093"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100018525","name":"Key Research and Development Program of Hubei Province","doi-asserted-by":"publisher","award":["2021BAA036"],"award-info":[{"award-number":["2021BAA036"]}],"id":[{"id":"10.13039\/501100018525","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3566847","type":"journal-article","created":{"date-parts":[[2025,5,5]],"date-time":"2025-05-05T13:55:09Z","timestamp":1746453309000},"page":"1-11","source":"Crossref","is-referenced-by-count":5,"title":["Highly Sensitive Fiber Gas Pressure Sensor Based on Two Diaphragm-Type Fabry\u2013P\u00e9rot Interferometers in Parallel Forming the Enhanced Vernier Effect"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0009-0003-1232-9110","authenticated-orcid":false,"given":"Shijie","family":"Xiao","sequence":"first","affiliation":[{"name":"School of Optical and Electronic Information, and Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6323-1082","authenticated-orcid":false,"given":"Kate","family":"Sugden","sequence":"additional","affiliation":[{"name":"Aston Institute of Photonic Technologies, Aston University, Birmingham, U.K."}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4888-0767","authenticated-orcid":false,"given":"Xuewen","family":"Shu","sequence":"additional","affiliation":[{"name":"School of Optical and Electronic Information, and Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2024.3419243"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2023.3279091"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.infrared.2023.105065"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1364\/ol.381452"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2023.3343828"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlastec.2022.107998"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1021\/acsami.2c09865"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1364\/ao.47.002835"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2018.2864277"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlastec.2022.108855"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/jlt.2021.3054883"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2022.3151368"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2022.3181098"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2022.3153993"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2023.3328391"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2024.3485459"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1002\/lpor.202000588"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2020.108451"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1364\/oe.26.028763"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1364\/jot.90.000046"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1364\/ol.489771"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1364\/prj.414121"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2022.3168290"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijleo.2023.170655"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.3390\/photonics9010031"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijleo.2021.167359"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1364\/oe.384815"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1364\/oe.463396"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2022.110973"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlastec.2022.108755"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/lpt.2017.2786292"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/jlt.2021.3088530"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2023.3281778"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-017-00931-0"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1088\/0026-1394\/30\/3\/004"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1364\/oe.469791"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1364\/oe.16.001020"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.3390\/s22051862"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlastec.2022.108532"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/10985858.pdf?arnumber=10985858","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,3,2]],"date-time":"2026-03-02T20:56:07Z","timestamp":1772484967000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10985858\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":39,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3566847","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}