{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,10]],"date-time":"2026-02-10T18:51:41Z","timestamp":1770749501551,"version":"3.50.0"},"reference-count":44,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52202428"],"award-info":[{"award-number":["52202428"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Hunan Natural Science Foundation Project","award":["2023JJ40750"],"award-info":[{"award-number":["2023JJ40750"]}]},{"name":"Guangdong Provincial Key Laboratory of Human Digital Twin","award":["2022B1212010004"],"award-info":[{"award-number":["2022B1212010004"]}]},{"DOI":"10.13039\/100016096","name":"Guangzhou Basic Research Program","doi-asserted-by":"publisher","award":["SL2023A04J00930"],"award-info":[{"award-number":["SL2023A04J00930"]}],"id":[{"id":"10.13039\/100016096","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3566852","type":"journal-article","created":{"date-parts":[[2025,5,5]],"date-time":"2025-05-05T17:55:09Z","timestamp":1746467709000},"page":"1-10","source":"Crossref","is-referenced-by-count":2,"title":["Enhanced Open-Circuit Fault Diagnosis in T-Type Inverters Using Conditional Virtual Sample Generation"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0009-0001-1029-9275","authenticated-orcid":false,"given":"Wenkang","family":"Zhang","sequence":"first","affiliation":[{"name":"School of Future Technology, South China University of Technology, Guangzhou, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0003-3460-9295","authenticated-orcid":false,"given":"Ying","family":"Hao","sequence":"additional","affiliation":[{"name":"School of Future Technology, South China University of Technology, Guangzhou, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2211-8232","authenticated-orcid":false,"given":"Shuyu","family":"Luo","sequence":"additional","affiliation":[{"name":"School of Future Technology, South China University of Technology, Guangzhou, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1739-7051","authenticated-orcid":false,"given":"Kaidi","family":"Li","sequence":"additional","affiliation":[{"name":"Shenzhen Metro Group, Shenzhen, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4249-1827","authenticated-orcid":false,"given":"Xun","family":"Wu","sequence":"additional","affiliation":[{"name":"School of Traffic and Transportation Engineering, Central South University, Changsha, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3020-3736","authenticated-orcid":false,"given":"Zhanpeng","family":"Jin","sequence":"additional","affiliation":[{"name":"School of Future Technology, South China University of Technology, Guangzhou, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2582344"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-024-53568-1"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2017.2697844"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2023.3289508"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3106767"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/PEAC.2014.7038054"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2019.2898105"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2024.3435717"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.3390\/s24031028"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/s43236-024-00879-1"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2024.3436122"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.3390\/en16062668"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3151731"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2021.3135039"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2024.3368791"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3088889"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2022.3198528"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.3048533"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2021.3053757"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.24295\/CPSSTPEA.2024.00012"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3024337"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3135328"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.3390\/electronics12194172"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.heliyon.2024.e39901"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.3389\/fenrg.2022.1090209"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.3390\/e25050778"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.egyr.2023.01.095"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.knosys.2019.07.008"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/OJIES.2023.3290169"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3169545"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3222663"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2024.3472780"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3125973"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3136175"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3246470"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3222506"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1016\/j.isatra.2023.04.035"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1016\/j.aei.2024.102837"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3331419"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3232649"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1016\/j.engappai.2025.110306"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.3390\/electronics12163460"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3131293"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1016\/j.rineng.2025.103991"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/10985852.pdf?arnumber=10985852","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,5,16]],"date-time":"2025-05-16T05:23:20Z","timestamp":1747373000000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10985852\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":44,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3566852","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}