{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,4]],"date-time":"2026-04-04T18:18:35Z","timestamp":1775326715315,"version":"3.50.1"},"reference-count":20,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"National Science and Technology Council (NSTC) and the Taiwan Semiconductor Research Institute (TSRI), Taiwan"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3569883","type":"journal-article","created":{"date-parts":[[2025,5,14]],"date-time":"2025-05-14T17:31:55Z","timestamp":1747243915000},"page":"1-12","source":"Crossref","is-referenced-by-count":1,"title":["A High Timing Resolution and Data Rate Pulse Generator for Automatic Test Equipment Applications"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-7045-6586","authenticated-orcid":false,"given":"Jen-Chieh","family":"Liu","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering, National United University, Miaoli, Taiwan"}]},{"ORCID":"https:\/\/orcid.org\/0009-0008-5990-1950","authenticated-orcid":false,"given":"Chi-Hua","family":"Chen","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, National United University, Miaoli, Taiwan"}]},{"ORCID":"https:\/\/orcid.org\/0009-0005-3292-8270","authenticated-orcid":false,"given":"Cheng-En","family":"Wu","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, National United University, Miaoli, Taiwan"}]}],"member":"263","reference":[{"key":"ref1","volume-title":"Arbitrary Waveform Generators-AWG4000 Series Datasheet","year":"2016"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2025.3545161"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2024.3486332"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2024.3364057"},{"key":"ref5","volume-title":"Chroma. IC Test Solutions\/SoC Test System","year":"2023"},{"key":"ref6","volume-title":"Panasonic Industry. IC Testers\/fest and Measurement Equipment Solutions"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2910921"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2015.2408803"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2017.2781421"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2006.1696272"},{"issue":"6","key":"ref11","first-page":"41","article-title":"All-digital process-variation-calibrated timing generator for ATE with 1.95-ps resolution and a maximum 1.2-GHz test rate","volume":"26","author":"Ryu","year":"2013","journal-title":"IEEE Trans. Very Large Scale Integr. (VLSI) Syst."},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1587\/transfun.E99.A.1415"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2020.3010535"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2009.2028748"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2009.2019396"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2017.2781302"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2013.2297412"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2010.5699174"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ICEMI59194.2023.10270486"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3094240"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/11004035.pdf?arnumber=11004035","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,5,24]],"date-time":"2025-05-24T04:42:11Z","timestamp":1748061731000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11004035\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3569883","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}