{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,11]],"date-time":"2026-06-11T16:27:17Z","timestamp":1781195237819,"version":"3.54.1"},"reference-count":31,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"name":"Braunschweig International Graduate School of Metrology"},{"name":"Laboratory for Emerging Nanometrology"},{"name":"German Research Foundation (DFG) through Germany\u2019s Excellence Strategy-EXC-2123 QuantumFrontiers","award":["390837967"],"award-info":[{"award-number":["390837967"]}]},{"name":"Volkswagen Foundation and the Ministry of Science and Culture of Lower Saxony through the Quantum Valley Lower Saxony Q1"},{"name":"the German Federal Ministry of Research, Technology and Space through the project \"Implementierung von Quantenalgorithmen aus Finanzwesen und Chemie auf einem Quantendemonstrator (ATIQ)\"","award":["13N16132"],"award-info":[{"award-number":["13N16132"]}]},{"name":"the German Federal Ministry of Research, Technology and Space through the project \"Qubits Control by Microwave Integrated Circuits (QuMIC)\" under Subcontract","award":["13N15930"],"award-info":[{"award-number":["13N15930"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3571087","type":"journal-article","created":{"date-parts":[[2025,5,19]],"date-time":"2025-05-19T17:56:36Z","timestamp":1747677396000},"page":"1-10","source":"Crossref","is-referenced-by-count":3,"title":["Cryogenic Evaluation of a Digital-to-Analog Converter for a Trapped-Ion Quantum Computer"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-6668-479X","authenticated-orcid":false,"given":"Alexander","family":"Meyer","sequence":"first","affiliation":[{"name":"Institute for CMOS Design, TU Braunschweig, Braunschweig, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9079-6692","authenticated-orcid":false,"given":"Paul Julius","family":"Ritter","sequence":"additional","affiliation":[{"name":"Institute for Electrical Measurement Science and Fundamental Electrical Engineering, TU Braunschweig, Braunschweig, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0008-0217-8060","authenticated-orcid":false,"given":"Marius","family":"Neumann","sequence":"additional","affiliation":[{"name":"Institute for Electrical Measurement Science and Fundamental Electrical Engineering, TU Braunschweig, Braunschweig, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0001-4384-6263","authenticated-orcid":false,"given":"Peter","family":"Toth","sequence":"additional","affiliation":[{"name":"Institute for CMOS Design, TU Braunschweig, Braunschweig, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6011-9597","authenticated-orcid":false,"given":"Sebastian","family":"Halama","sequence":"additional","affiliation":[{"name":"Institute of Quantum Optics, Leibniz University Hannover, Hannover, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0007-3864-816X","authenticated-orcid":false,"given":"Jens","family":"Repp","sequence":"additional","affiliation":[{"name":"Infineon Technologies AG, Neubiberg, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0003-4757-7093","authenticated-orcid":false,"given":"Matthias","family":"Brandl","sequence":"additional","affiliation":[{"name":"Infineon Technologies AG, Neubiberg, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5095-7922","authenticated-orcid":false,"given":"Benedikt","family":"Hampel","sequence":"additional","affiliation":[{"name":"Institute for Electrical Measurement Science and Fundamental Electrical Engineering, TU Braunschweig, Braunschweig, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7384-2028","authenticated-orcid":false,"given":"Meinhard","family":"Schilling","sequence":"additional","affiliation":[{"name":"Institute for Electrical Measurement Science and Fundamental Electrical Engineering, TU Braunschweig, Braunschweig, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3450-8745","authenticated-orcid":false,"given":"Vadim","family":"Issakov","sequence":"additional","affiliation":[{"name":"Institute for CMOS Design, TU Braunschweig, Braunschweig, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.22331\/q-2018-08-06-79"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1063\/1.5088164"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ESSDERC.2017.8066592"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JEDS.2024.3432283"},{"key":"ref5","first-page":"1","article-title":"A cryogenic high-voltage amplifier for ion traps","volume-title":"Proc. SMACD\/PRIME","author":"Sieberer"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ESSERC62670.2024.10719559"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JEDS.2018.2798281"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1063\/5.0245525"},{"key":"ref9","article-title":"Integrated technologies and control techniques for trapped ion array architectures","author":"Stuart","year":"2021"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1063\/1.4879136"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/BCICTS54660.2023.10310675"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ESSERC62670.2024.10719432"},{"key":"ref13","article-title":"Ion-based quantum computing hardware: Performance and end-user perspective","author":"Strohm","year":"2024","journal-title":"arXiv:2405.11450"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/rfic61187.2024.10600018"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1038\/nature00784"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1063\/1.4966970"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevApplied.11.024010"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1103\/RevModPhys.87.1419"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ESSERC62670.2024.10719474"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1002\/9780470891179"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.cryogenics.2014.04.014"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/16.925245"},{"key":"ref23","volume-title":"CMOS Analog Circuit Design","author":"Allen","year":"2012"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/VLSITechnologyandCir46769.2022.9830309"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/LSSC.2020.3011576"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/16.333812"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.cryogenics.2016.02.003"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1116\/1.5126186"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1063\/1.4832042"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1063\/1.4795552"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/QCE53715.2022.00123"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/11006730.pdf?arnumber=11006730","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,3]],"date-time":"2025-06-03T05:26:59Z","timestamp":1748928419000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11006730\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":31,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3571087","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}