{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,2]],"date-time":"2026-03-02T22:04:38Z","timestamp":1772489078321,"version":"3.50.1"},"reference-count":41,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Provincial Frontier Leading Technology Basic Research Major Project Fund","award":["BK20232028"],"award-info":[{"award-number":["BK20232028"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3571134","type":"journal-article","created":{"date-parts":[[2025,6,2]],"date-time":"2025-06-02T14:00:04Z","timestamp":1748872804000},"page":"1-12","source":"Crossref","is-referenced-by-count":0,"title":["Uncertainty Quantification Fault Diagnosis Method Based on Multisignal Domain Interpretable Neural Network"],"prefix":"10.1109","volume":"74","author":[{"given":"Jing","family":"Yang","sequence":"first","affiliation":[{"name":"School of Automation, Nanjing University of Science and Technology, Nanjing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0003-8844-7391","authenticated-orcid":false,"given":"Xuekang","family":"Yang","sequence":"additional","affiliation":[{"name":"School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ming","family":"Lyu","sequence":"additional","affiliation":[{"name":"School of Automation, Nanjing University of Science and Technology, Nanjing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0003-6575-4110","authenticated-orcid":false,"given":"Jie","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Automation, Nanjing University of Science and Technology, Nanjing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-021-01861-5"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2024.3352689"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2024.3463007"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2023.3244237"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.inffus.2023.03.008"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/3555803"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/3491209"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmsy.2022.03.009"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2022.108525"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmsy.2023.07.012"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/tnnls.2023.3319468"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/tsmc.2024.3427345"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2022.108648"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/jiot.2024.3387481"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/tii.2023.3241587"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-022-02020-0"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/tsmc.2020.3048950"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmsy.2023.06.015"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2023.110952"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2023.120860"},{"key":"ref21","article-title":"A novel unsupervised graph wavelet autoencoder for mechanical system fault detection","author":"Li","year":"2023","journal-title":"arXiv:2307.10676"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2024.124700"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/tsmc.2023.3346398"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2025.3538068"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/ad56b8"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/tnnls.2022.3202234"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.23919\/ecc.2001.7076127"},{"issue":"6","key":"ref28","article-title":"Fractional Fourier transform theory and its application research progress","volume":"45","author":"Ma","year":"2018","journal-title":"Opto-Electron. Eng."},{"key":"ref29","first-page":"1613","article-title":"Weight uncertainty in neural network","volume-title":"Proc. Int. Conf. Mach. Learn. (PMLR)","author":"Blundell"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1023\/A:1008932416310"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1162\/neco.2008.08-07-592"},{"key":"ref32","first-page":"19","volume-title":"Monte Carlo Theory, Methods and Examples","author":"Owen","year":"2013"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/j.patrec.2016.08.016"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/cvprw56347.2022.00278"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/fg52635.2021.9667055"},{"key":"ref36","article-title":"A comprehensive guide to Bayesian convolutional neural network with variational inference","author":"Shridhar","year":"2019","journal-title":"arXiv:1901.02731"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/tii.2018.2864759"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2015.04.021"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2023.3301888"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2024.3368479"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2024.111761"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/11007036.pdf?arnumber=11007036","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,3,2]],"date-time":"2026-03-02T20:56:02Z","timestamp":1772484962000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11007036\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":41,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3571134","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}