{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,21]],"date-time":"2026-04-21T14:52:43Z","timestamp":1776783163764,"version":"3.51.2"},"reference-count":39,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3574907","type":"journal-article","created":{"date-parts":[[2025,6,6]],"date-time":"2025-06-06T17:41:32Z","timestamp":1749231692000},"page":"1-12","source":"Crossref","is-referenced-by-count":5,"title":["Optimal Wavelet Packet Denoising Technique for the Detection of High-Impedance Faults in DC Microgrid"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0009-0003-8581-6585","authenticated-orcid":false,"given":"Rachita R.","family":"Sarangi","sequence":"first","affiliation":[{"name":"School of Electrical Sciences, Odisha University of Technology and Research (OUTR), Bhubaneswar, Odisha, India"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4632-6201","authenticated-orcid":false,"given":"Prakash K.","family":"Ray","sequence":"additional","affiliation":[{"name":"School of Electrical Sciences, Odisha University of Technology and Research (OUTR), Bhubaneswar, Odisha, India"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0551-7730","authenticated-orcid":false,"given":"Soumya R.","family":"Mohanty","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, IIT BHU Varanasi, Varanasi, Uttar Pradesh, India"}]},{"ORCID":"https:\/\/orcid.org\/0009-0008-7441-1095","authenticated-orcid":false,"given":"Pratik","family":"Kar","sequence":"additional","affiliation":[{"name":"School of Electrical Sciences, Odisha University of Technology and Research (OUTR), Bhubaneswar, Odisha, India"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6124-1957","authenticated-orcid":false,"given":"Asit","family":"Mohanty","sequence":"additional","affiliation":[{"name":"Center for Promotion of Research, Graphic Era University, Dehradun, Uttarakhand, India"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/tsg.2018.2828414"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1049\/gtd2.12128"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2021.107041"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1049\/iet-stg.2019.0091"},{"key":"ref5","author":"Gong","year":"2022","journal-title":"Distributed Intelligence for High Impedance Fault Detection in DER-Integrated Systems"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1186\/s41601-022-00232-3"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2021.3080376"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.3390\/en13236447"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2017.2758745"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/tia.2022.3206171"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/icpes.2017.8387273"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1049\/iet-gtd.2019.1338"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.apenergy.2021.118338"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1049\/iet-gtd.2017.0502"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/cciot.2016.7868316"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2015.2485339"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/PES.2010.5589520"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/access.2022.3179517"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/sustech.2017.8333510"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/jproc.2010.2081330"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.iot.2024.101148"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-93736-2_28"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2022.108254"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/esw49992.2023.10188343"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/isgt-asia.2017.8378426"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2012.2230597"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2024.3457954"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1111\/j.2517-6161.1995.tb02032.x"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2023.119745"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.3390\/s23146434"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/18.382009"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/j.bspc.2016.05.007"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/j.inffus.2021.07.006"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/jiot.2024.3425614"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/icip.1999.822933"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/tpwrd.2023.3327307"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1049\/iet-gtd.2017.1533"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/tia.2023.3332314"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/jsyst.2021.3057334"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/11027151.pdf?arnumber=11027151","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,16]],"date-time":"2025-06-16T18:57:35Z","timestamp":1750100255000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11027151\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":39,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3574907","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}